Detlev Richter
31Patents
9h-index
50Co-inventors
78Inventor score
Filing activity: Dec 16, 1976 → Jul 12, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7800943B2 | Integrated circuit having a memory cell arrangement and method for reading a memory cell state using a plurality of partial readings | Physics | 20 | Active |
| US6297995A | Circuit configuration with a temperature-dependent semiconductor component test and repair logic circuit | Physics | 17 | Expired |
| US7688634B2 | Method of operating an integrated circuit having at least one memory cell | Physics | 13 | Active |
| US6216248A | Integrated memory | Physics | 13 | Expired |
| US7649779B2 | Integrated circuits; methods for manufacturing an integrated circuit; memory modules; computing systems | Electricity | 12 | Active |
| US4121104A | X-ray examining device with automatic timer and film container for an X-ray examining device | Physics | 10 | Expired |
| US4486896A | X-Ray generator incorporating automatic correction of a dose-determining exposure parameter | Electricity | 10 | Expired |
| US7864579B2 | Integrated circuits having a controller to control a read operation and methods for operating the same | Physics | 10 | Active |
| US7813169B2 | Integrated circuit and method to operate an integrated circuit | Physics | 9 | Active |
| USD548871S1 | Lamp | General | 8 | Expired |
| US7940575B2 | Memory device and method providing logic connections for data transfer | Emerging Cross-Sectional Technologies | 6 | Active |
| US6779136B2 | Method for testing the refresh device of an information memory | Physics | 6 | Expired |
| US7778073B2 | Integrated circuit having NAND memory cell strings | Electricity | 6 | Active |
| US4313055A | Automatic exposure control device for an X-ray generator | Electricity | 6 | Expired |
| US6158029A | Method of testing an integrated circuit having a memory and a test circuit | Physics | 4 | Expired |
| US6279129A | Configuration of memory cells and method of checking the operation of memory cells | Physics | 4 | Expired |
| US7296202B2 | Semiconductor module with a configuration for the self-test of a plurality of interface circuits and test method | Physics | 4 | Expired |
| US8589765B1 | Memory read-out | Physics | 3 | Active |
| US7864593B2 | Method for classifying memory cells in an integrated circuit | Physics | 3 | Active |
| US7636258B2 | Integrated circuits, memory controller, and memory modules | Physics | 3 | Active |
| US7489563B2 | Memory device with adaptive sense unit and method of reading a cell array | Physics | 3 | Active |
| US7707380B2 | Memories, method of storing data in memory and method of determining memory cell sector quality | Physics | 3 | Active |
| US7190605B1 | Semiconductor memory and method for operating a semiconductor memory comprising a plurality of memory cells | Physics | 2 | Expired |
| US6877897B2 | Method for determining the temperature of a memory cell from transistor threshold voltage | Physics | 2 | Expired |
| US7457144B2 | Memory device and method for verifying information stored in memory cells | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.