Inventor · Koganei, JP

Eiji Takeda

44Patents
18h-index
104Co-inventors
84Inventor score

Filing activity: Oct 1, 1980 → Nov 10, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US5177576A Dynamic random access memory having trench capacitors and vertical transistors Electricity 118 Expired
US5355330A Capacitive memory having a PN junction writing and tunneling through an insulator of a charge holding electrode Electricity 111 Expired
US4455495A Programmable semiconductor integrated circuitry including a programming semiconductor element Electricity 111 Expired
US5466621A Method of manufacturing a semiconductor device having silicon islands Emerging Cross-Sectional Technologies 101 Expired
US5346834A Method for manufacturing a semiconductor device and a semiconductor memory device Emerging Cross-Sectional Technologies 79 Expired
USD524736S1 Housing for an electric connector General 60 Expired
US5115289A Semiconductor device and semiconductor memory device Electricity 56 Expired
US5140389A Semiconductor memory device having stacked capacitor cells Electricity 56 Expired
US4894696A Dynamic random access memory having a trench capacitor Emerging Cross-Sectional Technologies 54 Expired
US5053849A Transistor with overlapping gate/drain and two-layered gate structures Electricity 43 Expired
US5132771A Semiconductor memory device having flip-flop circuits Emerging Cross-Sectional Technologies 40 Expired
US5034797A Semiconductor memory devices having stacked polycrystalline silicon transistors Emerging Cross-Sectional Technologies 39 Expired
US5296729A Semiconductor memory device having static random access memory Emerging Cross-Sectional Technologies 39 Expired
US4656492A Insulated gate field effect transistor Electricity 34 Expired
US5357464A Semiconductor memory having writing and reading transistors, method of fabrication thereof, and method of use thereof Electricity 30 Expired
US6433548B1 RF coil, magnetic resonance signal measuring apparatus, and magnetic resonance imaging apparatus Physics 29 Expired
US5420436A Methods for measuring optical system, and method and apparatus for exposure using said measuring method Physics 26 Expired
US5270232A Process for fabricating field effect transistor Emerging Cross-Sectional Technologies 23 Expired
US5200635A Semiconductor device having a low-resistivity planar wiring structure Electricity 18 Expired
US5485497A Optical element and projection exposure apparatus employing the same Physics 15 Expired
US4977435A Semiconductor device with a split conduction channel Electricity 11 Expired
US7059901B2 Waterproof electrical connector Electricity 11 Expired
US5583358A Semiconductor memory device having stacked capacitors Electricity 10 Expired
US5374576A Method of fabricating stacked capacitor cell memory devices Electricity 8 Expired
US5591998A Semiconductor memory device Electricity 5 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.