Glen Wilk
49Patents
20h-index
31Co-inventors
81Inventor score
Filing activity: Jul 31, 1997 → Jul 1, 2011
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6013553A | Zirconium and/or hafnium oxynitride gate dielectric | Electricity | 808 | Expired |
| US7795160B2 | ALD of metal silicate films | Electricity | 396 | Active |
| US6291282A | Method of forming dual metal gate structures or CMOS devices | Electricity | 324 | Expired |
| US6020243A | Zirconium and/or hafnium silicon-oxynitride gate dielectric | Electricity | 267 | Expired |
| US6291867A | Zirconium and/or hafnium silicon-oxynitride gate dielectric | Electricity | 151 | Expired |
| US6291866A | Zirconium and/or hafnium oxynitride gate dielectric | Electricity | 117 | Expired |
| US6150242A | Method of growing crystalline silicon overlayers on thin amorphous silicon oxide layers and forming by method a resonant tunneling diode | Electricity | 103 | Expired |
| US6544875B1 | Chemical vapor deposition of silicate high dielectric constant materials | Electricity | 70 | Expired |
| US6255150A | Use of crystalline SiOx barriers for Si-based resonant tunneling diodes | Performing Operations; Transporting | 63 | Expired |
| US6770536B2 | Process for semiconductor device fabrication in which a insulating layer is formed on a semiconductor substrate | Electricity | 62 | Expired |
| US8334218B2 | Method of forming non-conformal layers | Electricity | 54 | Active |
| US6495474B1 | Method of fabricating a dielectric layer | Electricity | 49 | Expired |
| US6291283A | Method to form silicates as high dielectric constant materials | Electricity | 36 | Expired |
| US6248621A | Method of growing high-quality crystalline silicon quantum wells for RTD structures | Emerging Cross-Sectional Technologies | 33 | Expired |
| US7608549B2 | Method of forming non-conformal layers | Electricity | 32 | Active |
| US6258637A | Method for thin film deposition on single-crystal semiconductor substrates | Emerging Cross-Sectional Technologies | 31 | Expired |
| US6552388B2 | Hafnium nitride gate dielectric | Electricity | 31 | Expired |
| US6723581B1 | Semiconductor device having a high-K gate dielectric and method of manufacture thereof | Electricity | 29 | Expired |
| US6841439B1 | High permittivity silicate gate dielectric | Electricity | 25 | Expired |
| US6436801B1 | Hafnium nitride gate dielectric | Electricity | 24 | Expired |
| US6020247A | Method for thin film deposition on single-crystal semiconductor substrates | Emerging Cross-Sectional Technologies | 16 | Expired |
| US6797525B2 | Fabrication process for a semiconductor device having a metal oxide dielectric material with a high dielectric constant, annealed with a buffered anneal process | Electricity | 13 | Expired |
| US6245606A | Low temperature method for forming a thin, uniform layer of aluminum oxide | Electricity | 12 | Expired |
| US8268409B2 | Plasma-enhanced deposition of metal carbide films | Chemistry; Metallurgy | 11 | Active |
| US6277681A | Process to produce ultrathin crystalline silicon nitride on Si(111) for advanced gate dielectrics | Electricity | 11 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.