Inventor

Hao Chen

108Patents
12h-index
107Co-inventors
89Inventor score

Filing activity: Dec 6, 2002 → Mar 3, 2025

Most-cited inventions

PatentTitleAreaCited byStatus
US6855606B2 Semiconductor nano-rod devices Electricity 105 Expired
US7074656B2 Doping of semiconductor fin devices Electricity 98 Expired
US6720619B1 Semiconductor-on-insulator chip incorporating partially-depleted, fully-depleted, and multiple-gate devices Electricity 89 Expired
US9086452B2 Three-dimensional integrated circuit and method for wireless information access thereof Electricity 25 Active
US7176092B2 Gate electrode for a semiconductor fin device Electricity 20 Expired
US7608515B2 Diffusion layer for stressed semiconductor devices Electricity 18 Active
US7141459B2 Silicon-on-insulator ULSI devices with multiple silicon film thicknesses Electricity 16 Expired
US7230270B2 Self-aligned double gate device and method for forming same Electricity 16 Expired
US7585711B2 Semiconductor-on-insulator (SOI) strained active area transistor Electricity 15 Active
US7635632B2 Gate electrode for a semiconductor fin device Electricity 15 Active
US7728360B2 Multiple-gate transistor structure Electricity 15 Expired
USD973820S1 Swimming ring General 12 Active
US7105897B2 Semiconductor structure and method for integrating SOI devices and bulk devices Electricity 12 Expired
US8865539B2 Fully depleted SOI multiple threshold voltage application Electricity 11 Active
US9341671B2 Testing holders for chip unit and die package Physics 9 Active
US7382023B2 Fully depleted SOI multiple threshold voltage application Electricity 9 Expired
US7423323B2 Semiconductor device with raised segment Electricity 8 Expired
US8421073B2 Test structures for through silicon vias (TSVs) of three dimensional integrated circuit (3DIC) Electricity 8 Active
US8922230B2 3D IC testing apparatus Emerging Cross-Sectional Technologies 8 Active
US7701008B2 Doping of semiconductor fin devices Electricity 8 Active
US8957691B2 Probe cards for probing integrated circuits Physics 7 Active
US7948037B2 Multiple-gate transistor structure and method for fabricating Electricity 6 Active
US8053839B2 Doping of semiconductor fin devices Electricity 6 Active
US9664707B2 Testing holders for chip unit and die package Physics 6 Active
US9453877B2 Testing holders for chip unit and die package Physics 6 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.