Jeffrey A. Barnes
16Patents
7h-index
33Co-inventors
62Inventor score
Filing activity: Mar 30, 2005 → May 4, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7365045B2 | Aqueous cleaner with low metal etch rate comprising alkanolamine and tetraalkylammonium hydroxide | Chemistry; Metallurgy | 27 | Expired |
| US9074170B2 | Copper cleaning and protection formulations | Chemistry; Metallurgy | 20 | Active |
| US8685909B2 | Antioxidants for post-CMP cleaning formulations | Chemistry; Metallurgy | 19 | Active |
| US9063431B2 | Aqueous cleaner for the removal of post-etch residues | Chemistry; Metallurgy | 17 | Active |
| US8754021B2 | Non-amine post-CMP composition and method of use | Chemistry; Metallurgy | 15 | Active |
| US7922823B2 | Compositions for processing of semiconductor substrates | Chemistry; Metallurgy | 11 | Active |
| US9831088B2 | Composition and process for selectively etching metal nitrides | Electricity | 9 | Active |
| US10176979B2 | Post-CMP removal using compositions and method of use | Chemistry; Metallurgy | 7 | Active |
| US9546321B2 | Compositions and methods for selectively etching titanium nitride | Electricity | 4 | Active |
| US9528078B2 | Antioxidants for post-CMP cleaning formulations | Chemistry; Metallurgy | 2 | Active |
| US10392560B2 | Compositions and methods for selectively etching titanium nitride | Electricity | 2 | Active |
| US10557107B2 | Post chemical mechanical polishing formulations and method of use | Chemistry; Metallurgy | 1 | Active |
| USRE46427E1 | Antioxidants for post-CMP cleaning formulations | General | 1 | Active |
| US10347504B2 | Use of non-oxidizing strong acids for the removal of ion-implanted resist | Electricity | 0 | Active |
| US10340150B2 | Ni:NiGe:Ge selective etch formulations and method of using same | Electricity | 0 | Active |
| US9340760B2 | Non-amine post-CMP composition and method of use | Chemistry; Metallurgy | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.