Inventor · Atsugi, JP

Motoki NAKASHIMA

52Patents
7h-index
43Co-inventors
68Inventor score

Filing activity: Dec 22, 2006 → Aug 2, 2024

Most-cited inventions

PatentTitleAreaCited byStatus
US8454748B2 Method of calculating carrier mobility Emerging Cross-Sectional Technologies 18 Active
US9382611B2 Sputtering target, method for manufacturing sputtering target, and method for forming thin film Chemistry; Metallurgy 15 Active
US8889477B2 Method for forming thin film utilizing sputtering target Chemistry; Metallurgy 13 Active
US9653613B2 Semiconductor device and manufacturing method thereof Electricity 11 Active
US9368633B2 Oxide material and semiconductor device Chemistry; Metallurgy 9 Active
US9954115B2 Semiconductor device and method for manufacturing the same Electricity 8 Active
US9130048B2 Method for manufacturing a thin film semiconductor device Electricity 7 Active
US9437428B2 Method of manufacturing a semiconductor device having an oxide semiconductor layer with increased hydrogen concentration Electricity 7 Active
US9443987B2 Semiconductor device Electricity 7 Active
US9466728B2 Semiconductor device and method for manufacturing the same Electricity 5 Active
US11024725B2 Semiconductor device including metal oxide film Emerging Cross-Sectional Technologies 5 Active
US10079309B2 Oxide material and semiconductor device Chemistry; Metallurgy 5 Active
US10269979B2 Semiconductor device and method for manufacturing the same Electricity 5 Active
US9825181B2 Transistor, circuit, semiconductor device, display device, and electronic device Physics 3 Active
US11063066B2 C-axis alignment of an oxide film over an oxide semiconductor film Electricity 2 Active
US10658517B2 Semiconductor device and method for manufacturing the same Electricity 2 Active
US9816173B2 Semiconductor device and manufacturing method thereof Electricity 2 Active
US10304859B2 Semiconductor device having an oxide film on an oxide semiconductor film Electricity 2 Active
US11843004B2 Semiconductor device having specified relative material concentration between In—Ga—Zn—O films Electricity 1 Active
US8604545B2 Semiconductor device having single crystal silicon layer with local maximum of carbon concentration and shoulder peak of hydrogen concentration Electricity 1 Active
US11081326B2 Sputtering target and method for manufacturing the same Electricity 1 Active
US8975634B2 Semiconductor device including oxide semiconductor film Electricity 1 Active
US9331206B2 Oxide material and semiconductor device Electricity 1 Active
US12002876B2 Semiconductor device Emerging Cross-Sectional Technologies 0 Active
US10734413B2 Metal oxide and semiconductor device Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.