Muhammad Masuduzzaman
26Patents
3h-index
33Co-inventors
55Inventor score
Filing activity: Apr 30, 2015 → Jul 24, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10014063B2 | Smart skip verify mode for programming a memory device | Physics | 33 | Active |
| US9842657B1 | Multi-state program using controlled weak boosting for non-volatile memory | Physics | 15 | Active |
| US9779832B1 | Pulsed control line biasing in memory | Physics | 5 | Active |
| US9711211B2 | Dynamic threshold voltage compaction for non-volatile memory | Physics | 2 | Active |
| US11139038B1 | Neighboring or logical minus word line dependent verify with sense time in programming of non-volatile memory | Electricity | 1 | Active |
| US10312342B2 | NEMS devices with series ferroelectric negative capacitor | Electricity | 1 | Active |
| US11475967B1 | Modified verify in a memory device | Electricity | 1 | Active |
| US9755041B2 | NEMS devices with series ferroelectric negative capacitor | Electricity | 1 | Active |
| US12205657B2 | Hybrid smart verify for QLC/TLC die | Physics | 0 | Active |
| US11423993B2 | Bi-directional sensing in a memory | Physics | 0 | Active |
| US12354704B2 | Active current consumption save mode for non-volatile memory using fast programming | Physics | 0 | Active |
| US10984876B2 | Temperature based programming in memory | Physics | 0 | Active |
| US11830555B2 | Bias for data retention in fuse ROM and flash memory | Physics | 0 | Active |
| US12327046B2 | Data retention-specific refresh read | Physics | 0 | Active |
| US11081184B2 | Method of concurrent multi-state programming of non-volatile memory with bit line voltage step up | Physics | 0 | Active |
| US12057175B2 | Memory apparatus and method of operation using state dependent strobe tier scan to reduce peak ICC | Electricity | 0 | Active |
| US10217520B2 | Pulsed control line biasing in memory | Physics | 0 | Active |
| US12057168B2 | Neighbor aware multi-bias programming in scaled BICS | Electricity | 0 | Active |
| US12079496B2 | Bundle multiple timing parameters for fast SLC programming | Physics | 0 | Active |
| US11887677B2 | Quick pass write programming techniques in a memory device | Electricity | 0 | Active |
| US11417393B2 | Two-stage programming using variable step voltage (DVPGM) for non-volatile memory structures | Physics | 0 | Active |
| US11574693B2 | Memory apparatus and method of operation using periodic normal erase dummy cycle to improve stripe erase endurance and data retention | Physics | 0 | Active |
| US12142315B2 | Low power multi-level cell (MLC) programming in non-volatile memory structures | Physics | 0 | Active |
| US11776634B2 | Pulsed bias for power-up or read recovery | Physics | 0 | Active |
| US12112800B2 | High speed multi-level cell (MLC) programming in non-volatile memory structures | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.