Nigel G. Cave
32Patents
10h-index
44Co-inventors
75Inventor score
Filing activity: Jun 3, 1998 → Apr 18, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6037668A | Integrated circuit having a support structure | Electricity | 83 | Expired |
| US6313024A | Method for forming a semiconductor device | Electricity | 51 | Expired |
| US10026824B1 | Air-gap gate sidewall spacer and method | Electricity | 31 | Active |
| US6127258A | Method for forming a semiconductor device | Electricity | 30 | Expired |
| US9929157B1 | Tall single-fin fin-type field effect transistor structures and methods | Electricity | 21 | Active |
| US6232235A | Method of forming a semiconductor device | Electricity | 19 | Expired |
| US6475841B1 | Transistor with shaped gate electrode and method therefor | Electricity | 17 | Expired |
| US7109051B2 | Method of integrating optical devices and electronic devices on an integrated circuit | Electricity | 15 | Expired |
| US6924184B2 | Semiconductor device and method for forming a semiconductor device using post gate stack planarization | Electricity | 15 | Expired |
| US10236218B1 | Methods, apparatus and system for forming wrap-around contact with dual silicide | Electricity | 12 | Active |
| US7262105B2 | Semiconductor device with silicided source/drains | Electricity | 8 | Expired |
| US7067342B2 | Method of integrating optical devices and electronic devices on an integrated circuit | Electricity | 8 | Expired |
| US10290549B2 | Integrated circuit structure, gate all-around integrated circuit structure and methods of forming same | Electricity | 6 | Active |
| US7144784B2 | Method of forming a semiconductor device and structure thereof | Electricity | 6 | Expired |
| US6372665B1 | Method for forming a semiconductor device | Electricity | 6 | Expired |
| US10381459B2 | Transistors with H-shaped or U-shaped channels and method for forming the same | Electricity | 6 | Active |
| US9947589B1 | Methods of forming a gate contact for a transistor above an active region and the resulting device | Electricity | 5 | Active |
| US10204994B2 | Methods of forming a semiconductor device with a gate contact positioned above the active region | Electricity | 4 | Active |
| US6566264B1 | Method for forming an opening in a semiconductor device substrate | Electricity | 3 | Expired |
| US10249728B2 | Air-gap gate sidewall spacer and method | Electricity | 3 | Active |
| US10734525B2 | Gate-all-around transistor with spacer support and methods of forming same | Electricity | 2 | Active |
| US7470624B2 | Integrated assist features for epitaxial growth bulk/SOI hybrid tiles with compensation | Emerging Cross-Sectional Technologies | 2 | Active |
| US10211100B2 | Methods of forming an air gap adjacent a gate of a transistor and a gate contact above the active region of the transistor | Electricity | 2 | Active |
| US10468300B2 | Contacting source and drain of a transistor device | Electricity | 1 | Active |
| US9978608B2 | Fin patterning for a fin-type field-effect transistor | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.