Young Do Hur
23Patents
7h-index
13Co-inventors
66Inventor score
Filing activity: Mar 23, 1998 → May 17, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6744687B2 | Semiconductor memory device with mode register and method for controlling deep power down mode therein | Physics | 95 | Expired |
| US5952872A | Input/output voltage detection type substrate voltage generation circuit | Physics | 18 | Expired |
| US7212046B2 | Power-up signal generating apparatus | Physics | 12 | Expired |
| US8953403B1 | Semiconductor memory device | Physics | 11 | Active |
| US6639854B2 | Redundancy circuit of semiconductor memory device | Physics | 10 | Expired |
| US6141279A | Refresh control circuit | Physics | 10 | Expired |
| US7768842B2 | Semiconductor memory device voltage generating circuit for avoiding leakage currents of parasitic diodes | Physics | 9 | Active |
| US6518831B1 | Boosting circuit for high voltage operation | Electricity | 5 | Expired |
| US6545531B1 | Power voltage driver circuit for low power operation mode | Physics | 5 | Expired |
| US10915398B2 | Memory system and operating method thereof | Electricity | 3 | Active |
| US10884848B2 | Memory device, memory system including the same and operation method of the memory system | Physics | 3 | Active |
| US11030040B2 | Memory device detecting an error in write data during a write operation, memory system including the same, and operating method of memory system | Physics | 2 | Active |
| US7944278B2 | Circuit for generating negative voltage and semiconductor memory apparatus using the same | Physics | 2 | Active |
| US10810080B2 | Memory device selectively correcting an error in data during a read operation, memory system including the same, and operating method of memory system | Physics | 1 | Active |
| US7831405B2 | Semiconductor package capable of performing various tests and method of testing the same | Physics | 1 | Active |
| US7751230B2 | Negative voltage generating device | Physics | 1 | Active |
| US8319544B2 | Determining and using dynamic voltage scaling mode | Electricity | 1 | Active |
| US7852139B2 | Apparatus for generating internal voltage in semiconductor integrated circuit | Physics | 1 | Active |
| US10901842B2 | Memory system and operating method thereof | Electricity | 0 | Active |
| US7830999B2 | Apparatus and method of generating clock signal of semiconductor memory | Electricity | 0 | Active |
| US7890286B2 | Test circuit for performing multiple test modes | Physics | 0 | Active |
| US7840368B2 | Test circuit for performing multiple test modes | Physics | 0 | Active |
| US8687447B2 | Semiconductor memory apparatus and test method using the same | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.