Hyundai Microelectronics Co., Ltd.
20Patents
0Active
20Granted
31Portfolio score
Filing activity: Sep 18, 1997 → Mar 6, 2002
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6097635A | Sensing circuit for programming/reading multilevel flash memory | Physics | 40 | Expired |
| US6125064A | CAS latency control circuit | Physics | 16 | Expired |
| US6458627B1 | Semiconductor chip package and method of fabricating same | Electricity | 10 | Expired |
| US6104637A | Apparatus for programming threshold voltage for non-volatile memory cell and method therefor | Physics | 10 | Expired |
| US6192160A | Hardware architectures for image dilation and erosion operations | Physics | 9 | Expired |
| US6094389A | Semiconductor memory apparatus having refresh test circuit | Physics | 9 | Expired |
| US6104656A | Sense amplifier control circuit in semiconductor memory | Physics | 8 | Expired |
| US6358794B1 | Capacitor of semiconductor device and method of fabricating the same | Electricity | 7 | Expired |
| US6372116B1 | Method of forming a conductive layer and an electroplating apparatus thereof | Chemistry; Metallurgy | 7 | Expired |
| US6297091A | Method for fabricating contact pad for semiconductor device | Electricity | 6 | Expired |
| US6502214B1 | Memory test circuit | Physics | 5 | Expired |
| US6583054B2 | Method for forming conductive line in semiconductor device | Electricity | 4 | Expired |
| US6146932A | Method for fabricating metal-oxide-semiconductor field effect transistor device | Electricity | 4 | Expired |
| US6225820A | Semiconductor device having improved input buffer circuit | Electricity | 4 | Expired |
| US6664614B2 | Lead frame and bottom lead semiconductor package using the lead frame | Electricity | 4 | Expired |
| US6797135B2 | Electroplating apparatus | Chemistry; Metallurgy | 2 | Expired |
| US6265114A | Method of generating mask data in fabricating semiconductor devices | Physics | 1 | Expired |
| US6753564B2 | Capacitor of semiconductor device and method of fabricating the same | Electricity | 1 | Expired |
| US6340636B1 | Method for forming metal line in semiconductor device | Electricity | 1 | Expired |
| US6511890B2 | Method of fabricating a semiconductor device | Electricity | 1 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.