Inventor · South Burlington, VT, US

Alvin W. Strong

35Patents
9h-index
54Co-inventors
74Inventor score

Filing activity: May 9, 1996 → Sep 30, 2013

Most-cited inventions

PatentTitleAreaCited byStatus
US8053814B2 On-chip embedded thermal antenna for chip cooling Electricity 45 Active
US6762966B1 Method and circuit to investigate charge transfer array transistor characteristics and aging under realistic stress and its implementation to DRAM MOSFET array transistor Physics 45 Expired
US6750530B1 Semiconductor antifuse with heating element Electricity 29 Expired
US6603321B2 Method and apparatus for accelerated determination of electromigration characteristics of semiconductor wiring Electricity 24 Expired
US7096450B2 Enhancement of performance of a conductive wire in a multilayered substrate Electricity 22 Expired
US5898706A Structure and method for reliability stressing of dielectrics Physics 18 Expired
US5899724A Method for fabricating a titanium resistor Electricity 15 Expired
US6252275A Silicon-on-insulator non-volatile random access memory device Electricity 10 Expired
US8138573B2 On-chip heater and methods for fabrication thereof and use thereof Electricity 9 Active
US6088258A Structures for reduced topography capacitors Electricity 8 Expired
US7704847B2 On-chip heater and methods for fabrication thereof and use thereof Electricity 8 Active
US8120356B2 Measurement methodology and array structure for statistical stress and test of reliabilty structures Physics 8 Active
US6159787A Structures and processes for reduced topography trench capacitors Electricity 7 Expired
US6352902B1 Process of forming a capacitor on a substrate Electricity 7 Expired
US7064414B2 Heater for annealing trapped charge in a semiconductor device Electricity 5 Expired
US8555216B2 Structure for electrically tunable resistor Electricity 5 Active
US7023041B2 Trench capacitor vertical structure Electricity 5 Expired
US7298161B2 Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability Physics 5 Expired
US7512506B2 IC chip stress testing Physics 4 Active
US7723200B2 Electrically tunable resistor and related methods Electricity 4 Active
US7868640B2 Array-based early threshold voltage recovery characterization measurement Physics 4 Active
US8217671B2 Parallel array architecture for constant current electro-migration stress testing Physics 4 Active
US7315075B2 Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors Electricity 3 Expired
US7388274B2 Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors Electricity 2 Active
US6333239A Processes for reduced topography capacitors Electricity 1 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.