Inventor · Grenoble, FR

Benoit Froment

22Patents
3h-index
18Co-inventors
60Inventor score

Filing activity: Jun 18, 1999 → Oct 11, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US6366098B1 Test structure, integrated circuit, and test method Physics 16 Expired
US7638427B2 MOS transistor with fully silicided gate Electricity 7 Active
US10833027B2 Integrated physically unclonable function device with a set of transistors exhibiting a random distribution of threshold voltages Electricity 4 Active
US6504380B2 Device and method for checking integrated capacitors Electricity 2 Expired
US6627093B1 Method of manufacturing a vertical metal connection in an integrated circuit Electricity 2 Expired
US7018865B2 Method of protecting an element of an integrated circuit against the formation of a metal silicide Electricity 1 Expired
US8975682B2 Integrated circuit comprising a capacitor with HSG metal electrodes Electricity 0 Active
US11183468B2 Chip protected against back-face attacks Electricity 0 Active
US12063775B2 Read only memory Electricity 0 Active
US7947583B2 Forming of silicide areas in a semiconductor device Electricity 0 Active
US12328896B2 Semiconductor integrated circuit component Electricity 0 Active
US11818883B2 Read only memory Electricity 0 Active
US7622387B2 Gate electrode silicidation process Electricity 0 Expired
US12087708B2 Chip protected against back-face attacks Electricity 0 Active
US8354725B2 MIM transistor Electricity 0 Active
US10497653B2 Decoupling capacitor Electricity 0 Active
US10354926B2 Integrated circuit with improved resistive region Electricity 0 Active
US7781296B2 Integrated circuit comprising a capacitor with metal electrodes and process for fabricating such a capacitor Electricity 0 Expired
US10770357B2 Integrated circuit with improved resistive region Electricity 0 Active
US12052376B2 Integrated physical unclonable function device Electricity 0 Active
US10754618B2 Random number generator Electricity 0 Active
US8295028B2 Increasing the capacitance of a capacitive device by micromasking Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.