Inventor · Tainan, TW

Chwan-Ying Lee

37Patents
12h-index
15Co-inventors
78Inventor score

Filing activity: Jan 5, 1995 → Aug 31, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US6436816B1 Method of electroless plating copper on nitride barrier Electricity 297 Expired
US6180523A Copper metallization of USLI by electroless process Electricity 271 Expired
US6030877A Electroless gold plating method for forming inductor structures Electricity 116 Expired
US5583073A Method for producing electroless barrier layer and solder bump on chip Electricity 104 Expired
US5776813A Process to manufacture a vertical gate-enhanced bipolar transistor Electricity 77 Expired
US5801100A Electroless copper plating method for forming integrated circuit structures Emerging Cross-Sectional Technologies 57 Expired
US5917244A Integrated circuit inductor structure formed employing copper containing conductor winding layer clad with nickel containing conductor layer Emerging Cross-Sectional Technologies 42 Expired
US5795619A Solder bump fabricated method incorporate with electroless deposit and dip solder Chemistry; Metallurgy 21 Expired
US6333235A Method for forming SiGe bipolar transistor Electricity 21 Expired
US6180478A Fabrication process for a single polysilicon layer, bipolar junction transistor featuring reduced junction capacitance Electricity 18 Expired
US6406743B1 Nickel-silicide formation by electroless Ni deposition on polysilicon Electricity 17 Expired
US8766279B1 SiC-based trench-type schottky device Electricity 12 Active
US9368650B1 SiC junction barrier controlled schottky rectifier Electricity 8 Active
US6589849B1 Method for fabricating epitaxy base bipolar transistor Electricity 8 Expired
US6713377B2 Method of electroless plating copper on nitride barrier Electricity 8 Expired
US9246016B1 Silicon carbide semiconductor device Electricity 7 Active
US8841721B2 Stepped trench MOSFET and method of fabricating the same Electricity 6 Active
US6228733A Non-selective epitaxial depostion technology Electricity 4 Expired
US6660625B2 Method of electroless plating copper on nitride barrier Electricity 4 Expired
US9209293B2 Integrated device having MOSFET cell array embedded with barrier Schottky diode Electricity 3 Active
US10483389B2 Silicon carbide semiconductor device Electricity 3 Active
US6046107A Electroless copper employing hypophosphite as a reducing agent Chemistry; Metallurgy 3 Expired
US10418476B2 Silicon carbide semiconductor device Electricity 3 Active
US10020368B2 Silicon carbide semiconductor element and manufacturing method thereof Electricity 2 Active
US9018640B1 Silicon carbide power device equipped with termination structure Electricity 2 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.