Inventor · Santa Clara, CA, US

Doyle E. Bennett

38Patents
12h-index
50Co-inventors
84Inventor score

Filing activity: Jan 6, 1998 → Sep 21, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US5984769A Polishing pad having a grooved pattern for use in a chemical mechanical polishing apparatus Performing Operations; Transporting 99 Expired
US6273806A Polishing pad having a grooved pattern for use in a chemical mechanical polishing apparatus Performing Operations; Transporting 73 Expired
US6645061B1 Polishing pad having a grooved pattern for use in chemical mechanical polishing Performing Operations; Transporting 49 Expired
US7074109B1 Chemical mechanical polishing control system and method Electricity 28 Expired
US6135868A Groove cleaning device for chemical-mechanical polishing Performing Operations; Transporting 28 Expired
US7024268B1 Feedback controlled polishing processes Emerging Cross-Sectional Technologies 20 Expired
US8408965B2 Eddy current gain compensation Physics 16 Active
US6220941A Method of post CMP defect stability improvement Performing Operations; Transporting 16 Expired
US7247080B1 Feedback controlled polishing processes Emerging Cross-Sectional Technologies 16 Expired
US9281253B2 Determination of gain for eddy current sensor Electricity 15 Active
US6945845B2 Chemical mechanical polishing apparatus with non-conductive elements Performing Operations; Transporting 14 Expired
US6371836B1 Groove cleaning device for chemical-mechanical polishing Performing Operations; Transporting 13 Expired
US6572453B1 Multi-fluid polishing process Chemistry; Metallurgy 12 Expired
US6251001A Substrate polishing with reduced contamination Performing Operations; Transporting 9 Expired
US8393940B2 Molding windows in thin pads Performing Operations; Transporting 8 Active
US9636797B2 Adjusting eddy current measurements Performing Operations; Transporting 8 Active
US7621798B1 Reducing polishing pad deformation Performing Operations; Transporting 7 Active
US6991516B1 Chemical mechanical polishing with multi-stage monitoring of metal clearing Performing Operations; Transporting 7 Expired
US9227293B2 Multi-platen multi-head polishing architecture Performing Operations; Transporting 7 Active
US8157614B2 Method of making and apparatus having windowless polishing pad and protected fiber Performing Operations; Transporting 6 Active
US9205527B2 In-situ monitoring system with monitoring of elongated region Performing Operations; Transporting 4 Active
US7354334B1 Reducing polishing pad deformation Performing Operations; Transporting 4 Expired
US7255637B2 Carrier head vibration damping Performing Operations; Transporting 3 Expired
US9056383B2 Path for probe of spectrographic metrology system Performing Operations; Transporting 2 Active
US7494929B2 Automatic gain control Performing Operations; Transporting 2 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.