Dror Shemesh
29Patents
6h-index
40Co-inventors
69Inventor score
Filing activity: Nov 26, 2001 → Oct 7, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6670610B2 | System and method for directing a miller | Electricity | 40 | Expired |
| US8709269B2 | Method and system for imaging a cross section of a specimen | Physics | 24 | Active |
| US7297965B2 | Method and apparatus for sample formation and microanalysis in a vacuum chamber | Electricity | 21 | Expired |
| US7683317B2 | Method and system for detecting hidden defects | Electricity | 16 | Active |
| US7365320B2 | Methods and systems for process monitoring using x-ray emission | Physics | 11 | Expired |
| US7233008B1 | Multiple electrode lens arrangement and a method for inspecting an object | Physics | 7 | Expired |
| US7473911B2 | Specimen current mapper | Electricity | 6 | Expired |
| US7659506B2 | Method and system for generating and reviewing a thin sample | Electricity | 6 | Active |
| US9805909B1 | Method for detecting voids in interconnects and an inspection system | Electricity | 5 | Active |
| US7161158B2 | System and method for fast focal length alterations | Electricity | 3 | Expired |
| US7847267B2 | Scanning electron microscope having multiple detectors and a method for multiple detector based imaging | Electricity | 3 | Expired |
| US11022565B2 | Process monitoring | Physics | 2 | Active |
| US10922809B2 | Method for detecting voids and an inspection system | Electricity | 2 | Active |
| US7912657B2 | Method and system for providing a compensated auger spectrum | Physics | 2 | Active |
| US7271396B2 | Method and device for aligning a charged particle beam column | Electricity | 2 | Expired |
| US9899185B1 | Resolving ambiguities in an energy spectrum | Electricity | 1 | Active |
| US9490101B2 | System and method for scanning an object | Electricity | 1 | Active |
| US7838830B2 | Charged particle beam apparatus and method for operating a charged particle beam apparatus | Electricity | 1 | Active |
| US8723144B2 | Apparatus for sample formation and microanalysis in a vacuum chamber | Electricity | 1 | Active |
| US11423529B2 | Determination of defect location for examination of a specimen | Emerging Cross-Sectional Technologies | 1 | Active |
| US6894294B2 | System and method for reducing charged particle contamination | Electricity | 1 | Expired |
| US7842930B2 | Charged particle detector assembly, charged particle beam apparatus and method for generating an image | Electricity | 1 | Active |
| US10347462B2 | Imaging of crystalline defects | Electricity | 1 | Active |
| US7312446B2 | Methods and systems for process monitoring using x-ray emission | Physics | 1 | Expired |
| US6900065B2 | Apparatus and method for enhanced voltage contrast analysis | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.