Inventor · Seoul, KR

Ha-Jin Lim

35Patents
7h-index
49Co-inventors
65Inventor score

Filing activity: Apr 15, 2005 → Oct 17, 2019

Most-cited inventions

PatentTitleAreaCited byStatus
US7482677B2 Dielectric structures having high dielectric constants, and non-volatile semiconductor memory devices having the dielectric structures Electricity 88 Active
US7651729B2 Method of fabricating metal silicate layer using atomic layer deposition technique Chemistry; Metallurgy 60 Active
US7547951B2 Semiconductor devices having nitrogen-incorporated active region and methods of fabricating the same Electricity 21 Active
US7952118B2 Semiconductor device having different metal gate structures Electricity 10 Active
US7829953B2 Semiconductor device and method of fabricating the same Electricity 9 Active
US9859392B2 Integrated circuit device and method of manufacturing the same Electricity 8 Active
US7973309B2 TEG pattern for detecting void in device isolation layer and method of forming the same Electricity 7 Active
US7396777B2 Method of fabricating high-k dielectric layer having reduced impurity Electricity 6 Expired
US8476155B1 Formation of a high-K crystalline dielectric composition Electricity 6 Active
US8563411B2 Semiconductor devices having a diffusion barrier layer and methods of manufacturing the same Electricity 4 Active
US8502286B2 Etch stop layers and methods of forming the same Electricity 3 Active
US11183525B2 Image sensor including laser shield pattern Electricity 2 Active
US11152415B2 Image sensor with separation pattern and image sensor module including the same Electricity 2 Active
US8877579B2 Methods of manufacturing semiconductor devices Electricity 2 Active
US7615830B2 Transistors with multilayered dielectric films Electricity 2 Active
US8013402B2 Transistors with multilayered dielectric films Electricity 1 Active
US9728463B2 Methods of manufacturing semiconductor devices Electricity 1 Active
US8227308B2 Method of fabricating semiconductor integrated circuit device Electricity 1 Active
US8963227B2 Semiconductor devices having a diffusion barrier layer and methods of manufacturing the same Electricity 1 Active
US8951853B1 Method of forming semiconductor device using Si-H rich silicon nitride layer Electricity 1 Active
US7767512B2 Methods of manufacturing a semiconductor device including CMOS transistor having different PMOS and NMOS gate electrode structures Electricity 0 Active
US9023718B2 Method of fabricating semiconductor device Electricity 0 Active
US8252674B2 Transistors with multilayered dielectric films and methods of manufacturing such transistors Electricity 0 Active
US8673747B2 Method of fabricating semiconductor device Electricity 0 Active
US10312341B2 Integrated circuit device and method of manufacturing the same Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.