Inventor · Seoul, KR

Hanjin Lim

19Patents
3h-index
48Co-inventors
56Inventor score

Filing activity: Nov 7, 2011 → Sep 9, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US9337149B2 Semiconductor devices and methods of fabricating the same Electricity 15 Active
US9673272B2 Semiconductor device including capacitor and method of fabricating the same Electricity 12 Active
US9305928B2 Semiconductor devices having a silicon-germanium channel layer and methods of forming the same Electricity 9 Active
US10892345B2 Semiconductor device Electricity 2 Active
US8698221B2 Capacitor that includes dielectric layer structure having plural metal oxides doped with different impurities Electricity 2 Active
US9685318B2 Method of forming semiconductor device Electricity 1 Active
US11978704B2 Wiring structure and electronic device employing the same Electricity 0 Active
US10930654B2 Semiconductor devices Electricity 0 Active
US12057470B2 Semiconductor devices Electricity 0 Active
US11621339B2 Semiconductor device including capacitor Electricity 0 Active
US12334308B2 Batch-type apparatus for atomic layer etching (ALE), and ALE method and semiconductor device manufacturing method based on the same apparatus Electricity 0 Active
US11764283B2 Semiconductor device including capacitor Electricity 0 Active
US9812332B2 Etching methods and methods of manufacturing semiconductor devices using the same Electricity 0 Active
US12295136B2 Integrated circuit semiconductor device Electricity 0 Active
US11114541B2 Semiconductor device including capacitor Electricity 0 Active
US11784213B2 Integrated circuit device Electricity 0 Active
US12336202B2 Integrated circuit device Electricity 0 Active
US11901291B2 Semiconductor devices including lower electrodes including inner protective layer and outer protective layer Electricity 0 Active
US12199138B2 Semiconductor device including capacitor structure and method for manufacturing the same Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.