Hui-Chi Chen
51Patents
3h-index
66Co-inventors
65Inventor score
Filing activity: Apr 24, 2008 → Jun 25, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10163704B2 | Semiconductor device and a method for fabricating the same | Electricity | 13 | Active |
| US11145564B2 | Multi-layer passivation structure and method | Electricity | 4 | Active |
| US10861810B2 | Shielding structures | Electricity | 4 | Active |
| US8198196B1 | High aspect ratio trench structures with void-free fill material | Electricity | 3 | Active |
| US8039401B2 | Structure and method for forming hybrid substrate | Electricity | 3 | Active |
| US11189538B2 | Semiconductor structure with polyimide packaging and manufacturing method | Electricity | 2 | Active |
| US11443984B2 | Semiconductor device and a method for fabricating the same | Electricity | 2 | Active |
| US11437331B2 | Chip structure and method for forming the same | Electricity | 2 | Active |
| US9891770B2 | Methods for forming a patterned structure in a sensor | Physics | 2 | Active |
| US10529824B2 | Semiconductor device and method for fabricating the same | Electricity | 2 | Active |
| US10734474B2 | Metal-insulator-metal structure and methods of fabrication thereof | Electricity | 2 | Active |
| US11521970B2 | Semiconductor device and a method for fabricating the same | Electricity | 2 | Active |
| US11031458B2 | Metal-insulator-metal (MIM) capacitor structure and method for forming the same | Electricity | 2 | Active |
| US11670608B2 | Prevention of metal pad corrosion due to exposure to halogen | Electricity | 1 | Active |
| US11222946B2 | Semiconductor device including a high density MIM capacitor and method | Electricity | 1 | Active |
| US10101857B2 | Methods for integrating a compliant material with a substrate | Electricity | 1 | Active |
| US10734283B2 | Semiconductor device and a method for fabricating the same | Electricity | 1 | Active |
| US7956411B2 | High aspect ratio trench structures with void-free fill material | Electricity | 1 | Active |
| US11605720B2 | Metal gate cap | Electricity | 1 | Active |
| US10468478B2 | Metal-insulator-metal (MIM) capacitor structure and method for forming the same | Electricity | 1 | Active |
| US12433011B2 | Post gate dielectric processing for semiconductor device fabrication | Electricity | 0 | Active |
| US11855022B2 | Shielding structures | Electricity | 0 | Active |
| US12211845B2 | Semiconductor device and a method for fabricating the same | Electricity | 0 | Active |
| US12057419B2 | Method for forming chip structure with conductive structure | Electricity | 0 | Active |
| US11404558B2 | Semiconductor device and a method for fabricating the same | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.