Josef Biberger
26Patents
2h-index
30Co-inventors
53Inventor score
Filing activity: Dec 22, 2010 → Apr 11, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10658152B1 | Method for controlling a particle beam device and particle beam device for carrying out the method | Electricity | 5 | Active |
| US10483084B2 | Object preparation device and particle beam device having an object preparation device and method for operating the particle beam device | Electricity | 2 | Active |
| US11215536B2 | Method and apparatus for capturing volume information of three-dimensional samples | Electricity | 2 | Active |
| US9251997B2 | Method for processing and/or for observing an object, and particle beam device for carrying out the method | Electricity | 1 | Active |
| US8816303B2 | Method of processing of an object | Electricity | 1 | Active |
| US8723136B2 | Particle beam system and method for operating the same | Electricity | 1 | Active |
| US9558911B2 | Method for analyzing and/or processing an object as well as a particle beam device for carrying out the method | Electricity | 1 | Active |
| US9190242B2 | Particle beam device having a sample holder | Electricity | 1 | Active |
| US10279419B2 | Methods and systems for raster scanning a surface of an object using a particle beam | Electricity | 1 | Active |
| US8759796B2 | Particle beam system | Electricity | 1 | Active |
| US10615002B2 | Method for operating a plurality of FIB-SEM systems | Electricity | 0 | Active |
| US8710451B2 | Ion beam system and method of operating ion beam system | Electricity | 0 | Active |
| US9136090B2 | Method and apparatus for scanning a surface of an object using a particle beam | Electricity | 0 | Active |
| US9960012B2 | Method for structuring an object and associated particle beam system | Electricity | 0 | Active |
| US12300459B2 | Method for positioning objects in a particle beam microscope with the aid of a flexible particle beam barrier | Electricity | 0 | Active |
| US10319561B2 | Object preparation device and particle beam device with an object preparation device and method for operating the particle beam device | Electricity | 0 | Active |
| US9685300B2 | Method for processing and/or for observing an object, and particle beam device for carrying out the method | Electricity | 0 | Active |
| US10741360B2 | Method for producing a TEM sample | Electricity | 0 | Active |
| US8921805B2 | Ion beam system and method of operating an ion beam system | Electricity | 0 | Active |
| US11474004B2 | Microtome | Physics | 0 | Active |
| US8927948B2 | Particle beam system and method for operating the same | Electricity | 0 | Active |
| US11152187B2 | Method and apparatus for positioning microscopic specimens with the aid of a two-dimensional position table | Electricity | 0 | Active |
| US11504798B2 | Methods and systems for raster scanning a surface of an object using a particle beam | Electricity | 0 | Active |
| US8471202B2 | Method for producing a representation of an object by means of a particle beam, as well as a particle beam device for carrying out the method | Electricity | 0 | Active |
| US11501948B2 | Operating a particle beam device | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.