Mitsuaki Hori
25Patents
6h-index
40Co-inventors
69Inventor score
Filing activity: Sep 5, 1984 → May 25, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4623173A | Screw joint coupling for oil pipes | Mechanical Engineering; Lighting; Heating | 52 | Expired |
| US4984829A | Screw coupling joint | Fixed Constructions | 49 | Expired |
| US6215163A | Semiconductor device and method of manufacturing the same where the nitrogen concentration in an oxynitride insulating layer is varied | Electricity | 17 | Expired |
| US6953727B2 | Manufacture method of semiconductor device with gate insulating films of different thickness | Emerging Cross-Sectional Technologies | 16 | Expired |
| US5549336A | High torque tool joint | Mechanical Engineering; Lighting; Heating | 13 | Expired |
| US5564413A | Oil well pipe for a casing | Fixed Constructions | 6 | Expired |
| US7514376B2 | Manufacture of semiconductor device having nitridized insulating film | Electricity | 4 | Expired |
| US8227355B2 | Method and apparatus of fabricating semiconductor device | Emerging Cross-Sectional Technologies | 3 | Active |
| US6800538B2 | Semiconductor device fabrication method and semiconductor fabrication control method | Electricity | 2 | Expired |
| US6709959B2 | Semiconductor device having a shallow junction and a fabrication process thereof | Electricity | 2 | Expired |
| US8778786B1 | Method for substrate preservation during transistor fabrication | Electricity | 1 | Active |
| US7361613B2 | Semiconductor device, manufacture and evaluation methods for semiconductor device, and process condition evaluation method | Electricity | 1 | Active |
| US9431285B2 | Method of manufacturing semiconductor device | Electricity | 1 | Active |
| US7678711B2 | Semiconductor device, and method and apparatus for manufacturing the same | Electricity | 1 | Expired |
| US9748231B2 | Semiconductor device | Electricity | 0 | Active |
| US9691767B2 | Semiconductor device and manufacturing method of semiconductor device | Electricity | 0 | Active |
| US9147744B2 | Semiconductor device and manufacturing method of semiconductor device | Electricity | 0 | Active |
| US10090201B2 | Method of manufacturing semiconductor device reducing variation in thickness of silicon layer among semiconductor wafers | Electricity | 0 | Active |
| US8980710B2 | Manufacturing method of semiconductor device | Electricity | 0 | Active |
| US9634021B2 | Method of manufacturing semiconductor device | Electricity | 0 | Active |
| US7098153B2 | Semiconductor device, manufacture and evaluation methods for semiconductor device, and process condition evaluation method | Electricity | 0 | Expired |
| US9390960B2 | Method of manufacturing semiconductor device | General | 0 | Revoked |
| US10192866B2 | Semiconductor device and manufacturing method of semiconductor device | Electricity | 0 | Active |
| US9685442B2 | Semiconductor device and method of manufacturing the same | Electricity | 0 | Active |
| US9153501B2 | Method for manufacturing semiconductor device | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.