Scott Luning
98Patents
22h-index
82Co-inventors
91Inventor score
Filing activity: Nov 29, 1994 → Mar 5, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6972478B1 | Integrated circuit and method for its manufacture | Electricity | 575 | Expired |
| US6351013B1 | Low-K sub spacer pocket formation for gate capacitance reduction | Emerging Cross-Sectional Technologies | 231 | Expired |
| US5989963A | Method for obtaining a steep retrograde channel profile | Electricity | 136 | Expired |
| US5614765A | Self aligned via dual damascene | Electricity | 125 | Expired |
| US5705430A | Dual damascene with a sacrificial via fill | Electricity | 113 | Expired |
| US5795823A | Self aligned via dual damascene | Electricity | 79 | Expired |
| US7138320B2 | Advanced technique for forming a transistor having raised drain and source regions | Electricity | 69 | Expired |
| US5686354A | Dual damascene with a protective mask for via etching | Electricity | 63 | Expired |
| US6482726B1 | Control trimming of hard mask for sub-100 nanometer transistor gate | Electricity | 57 | Expired |
| US5691238A | Subtractive dual damascene | Electricity | 57 | Expired |
| US6506642B1 | Removable spacer technique | Electricity | 37 | Expired |
| US5770519A | Copper reservoir for reducing electromigration effects associated with a conductive via in a semiconductor device | Electricity | 35 | Expired |
| US6107149A | CMOS semiconductor device comprising graded junctions with reduced junction capacitance | Emerging Cross-Sectional Technologies | 31 | Expired |
| US5888867A | Non-uniform threshold voltage adjustment in flash eproms through gate work function alteration | Electricity | 30 | Expired |
| US6051473A | Fabrication of raised source-drain transistor devices | Electricity | 30 | Expired |
| US5998272A | Silicidation and deep source-drain formation prior to source-drain extension formation | Electricity | 26 | Expired |
| US5482881A | Method of making flash EEPROM memory with reduced column leakage current | Electricity | 26 | Expired |
| US5650343A | Self-aligned implant energy modulation for shallow source drain extension formation | Electricity | 25 | Expired |
| US6180468A | Very low thermal budget channel implant process for semiconductors | Electricity | 23 | Expired |
| US6589847B1 | Tilted counter-doped implant to sharpen halo profile | Electricity | 22 | Expired |
| US6372587B1 | Angled halo implant tailoring using implant mask | Electricity | 22 | Expired |
| US6005279A | Trench edge spacer formation | Electricity | 22 | Expired |
| US7176110B2 | Technique for forming transistors having raised drain and source regions with different heights | Electricity | 17 | Expired |
| US8120120B2 | Embedded silicon germanium source drain structure with reduced silicide encroachment and contact resistance and enhanced channel mobility | Electricity | 16 | Active |
| US6232166A | CMOS processing employing zero degree halo implant for P-channel transistor | Electricity | 16 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.