Aiping Wu
21Patents
3h-index
31Co-inventors
59Inventor score
Filing activity: Feb 3, 2005 → Mar 28, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8361237B2 | Wet clean compositions for CoWP and porous dielectrics | Physics | 20 | Active |
| US7879782B2 | Aqueous cleaning composition and method for using same | Chemistry; Metallurgy | 7 | Active |
| US7534753B2 | pH buffered aqueous cleaning composition and method for removing photoresist residue | Chemistry; Metallurgy | 6 | Active |
| US7879783B2 | Cleaning composition for semiconductor substrates | Chemistry; Metallurgy | 3 | Active |
| US9042142B2 | Multi-level voltage converter | Electricity | 3 | Active |
| US8772214B2 | Aqueous cleaning composition for removing residues and method using same | Chemistry; Metallurgy | 2 | Active |
| US10400167B2 | Etching compositions and methods for using same | Electricity | 1 | Active |
| US9201308B2 | Water-rich stripping and cleaning formulation and method for using same | Chemistry; Metallurgy | 1 | Active |
| US10073351B2 | Semi-aqueous photoresist or semiconductor manufacturing residue stripping and cleaning composition with improved silicon passivation | Chemistry; Metallurgy | 1 | Active |
| US12110435B2 | Etching composition and method for selectively removing silicon nitride during manufacture of a semiconductor device | Electricity | 1 | Active |
| US7888302B2 | Aqueous based residue removers comprising fluoride | Chemistry; Metallurgy | 1 | Active |
| US7682458B2 | Aqueous based residue removers comprising fluoride | Chemistry; Metallurgy | 0 | Active |
| US12281251B2 | Etching composition and method for selectively removing silicon nitride during manufacture of a semiconductor device | Electricity | 0 | Active |
| US12298669B2 | Composition comprising three alkanolamines and a hydroxylamine for removing etch residues | Chemistry; Metallurgy | 0 | Active |
| US12325844B2 | Photoresist remover | Chemistry; Metallurgy | 0 | Active |
| US8518865B2 | Water-rich stripping and cleaning formulation and method for using same | Chemistry; Metallurgy | 0 | Active |
| US8283260B2 | Process for restoring dielectric properties | Electricity | 0 | Active |
| US11091727B2 | Post etch residue cleaning compositions and methods of using the same | Chemistry; Metallurgy | 0 | Active |
| US8288330B2 | Composition and method for photoresist removal | Electricity | 0 | Active |
| US9536730B2 | Cleaning formulations | Physics | 0 | Active |
| US8889609B2 | Cleaning formulations and method of using the cleaning formulations | Chemistry; Metallurgy | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.