Christopher J. Gambee
24Patents
3h-index
24Co-inventors
59Inventor score
Filing activity: May 5, 2005 → Aug 14, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9299663B2 | Semiconductor devices and methods for backside photo alignment | Electricity | 9 | Active |
| US8659153B2 | Pillar on pad interconnect structures, semiconductor dice and die assemblies including such interconnect structures, and related methods | Electricity | 6 | Active |
| US10332792B1 | Methods of fabricating conductive traces and resulting structures | Electricity | 4 | Active |
| US9318438B2 | Semiconductor structures comprising at least one through-substrate via filled with conductive materials | Electricity | 3 | Active |
| US9704781B2 | Under-bump metal structures for interconnecting semiconductor dies or packages and associated systems and methods | Electricity | 3 | Active |
| US7402908B2 | Intermediate semiconductor device structures | Electricity | 3 | Expired |
| US8470710B2 | Methods of forming a metal pattern | Electricity | 2 | Active |
| US10002840B1 | Semiconductor devices having discretely located passivation material, and associated systems and methods | Electricity | 2 | Active |
| US8008196B2 | Method to create a metal pattern using a damascene-like process | Electricity | 2 | Active |
| US9741612B2 | Semiconductor devices and methods for backside photo alignment | Electricity | 1 | Active |
| US8329580B2 | Methods of forming a metal pattern and semiconductor device structure | Electricity | 1 | Active |
| US9129869B2 | Pillar on pad interconnect structures, semiconductor devices including same and related methods | Electricity | 1 | Active |
| US9034769B2 | Methods of selectively removing a substrate material | Electricity | 1 | Active |
| US10896886B2 | Semiconductor devices having discretely located passivation material, and associated systems and methods | Electricity | 0 | Active |
| US9966347B2 | Under-bump metal structures for interconnecting semiconductor dies or packages and associated systems and methods | Electricity | 0 | Active |
| US11094684B2 | Edge cut debond using a temporary filler material with no adhesive properties and edge cut debond using an engineered carrier to enable topography | Electricity | 0 | Active |
| US10403618B2 | Edge cut debond using a temporary filler material with no adhesive properties and edge cut debond using an engineered carrier to enable topography | Electricity | 0 | Active |
| US10748857B2 | Die features for self-alignment during die bonding | Electricity | 0 | Active |
| US10811313B2 | Methods of fabricating conductive traces and resulting structures | Electricity | 0 | Active |
| US11302653B2 | Die features for self-alignment during die bonding | Electricity | 0 | Active |
| US11276658B2 | Devices with three-dimensional structures and support elements to increase adhesion to substrates | Electricity | 0 | Active |
| US10923478B2 | Reduction of roughness on a sidewall of an opening | Electricity | 0 | Active |
| US10262961B2 | Semiconductor devices having discretely located passivation material, and associated systems and methods | Electricity | 0 | Active |
| US10790251B2 | Methods for enhancing adhesion of three-dimensional structures to substrates | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.