Inventor · Plano, TX, US

Duane E. Carter

20Patents
12h-index
39Co-inventors
81Inventor score

Filing activity: Jan 23, 1984 → Mar 6, 2003

Most-cited inventions

PatentTitleAreaCited byStatus
US6028690A Reduced micromirror mirror gaps for improved contrast ratio Physics 315 Expired
US6282010A Anti-reflective coatings for spatial light modulators Physics 309 Expired
US5512130A Method and apparatus of etching a clean trench in a semiconductor material Electricity 50 Expired
US6184129A Low resistivity poly-silicon gate produced by selective metal growth Electricity 33 Expired
US4849067A Method for etching tungsten Electricity 28 Expired
US6100188A Stable and low resistance metal/barrier/silicon stack structure and related process for manufacturing Electricity 27 Expired
US4874723A Selective etching of tungsten by remote and in situ plasma generation Emerging Cross-Sectional Technologies 22 Expired
US4502915A Two-step plasma process for selective anisotropic etching of polycrystalline silicon without leaving residue Electricity 21 Expired
US4997520A Method for etching tungsten Chemistry; Metallurgy 21 Expired
US4842680A Advanced vacuum processor Electricity 15 Expired
US6423627B1 Method for forming memory array and periphery contacts using a same mask Electricity 13 Expired
US5835336A Complemetary reset scheme for micromechanical devices Physics 13 Expired
US4945069A Organic space holder for trench processing Electricity 12 Expired
US4623417A Magnetron plasma reactor Electricity 11 Expired
US4685999A Apparatus for plasma assisted etching Electricity 8 Expired
US5252506A Method to eliminate gate filaments on field plate isolated devices Electricity 6 Expired
US6544886B2 Process for isolating an exposed conducting surface Electricity 4 Expired
US4849068A Apparatus and method for plasma-assisted etching Electricity 1 Expired
US6271078A Simplifying conductive plate/via isolation Electricity 0 Expired
US6967054B2 Coating thickness control using surface features Emerging Cross-Sectional Technologies 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.