Inventor · Kasai, JP

Jun Ohtani

24Patents
14h-index
11Co-inventors
74Inventor score

Filing activity: Sep 12, 1994 → Jan 25, 2005

Most-cited inventions

PatentTitleAreaCited byStatus
US7173857B2 Nonvolatile semiconductor memory device capable of uniformly inputting/outputting data Physics 409 Expired
US6807101B2 Semiconductor memory device Physics 89 Expired
US5521878A Clock synchronous semiconductor memory device Physics 65 Expired
US6421286B1 Semiconductor integrated circuit device capable of self-analyzing redundancy replacement adapting to capacities of plural memory circuits integrated therein Physics 62 Expired
US5708622A Clock synchronous semiconductor memory device Physics 36 Expired
US5835448A Clock synchronous semiconductor memory device for determining an operation mode Physics 32 Expired
US6856550B2 Nonvolatile semiconductor memory device capable of uniformly inputting/outputting data Physics 27 Expired
US6297997A Semiconductor device capable of reducing cost of analysis for finding replacement address in memory array Physics 27 Expired
US6717844B1 Semiconductor memory device with latch circuit and two magneto-resistance elements Physics 25 Expired
US6130852A Memory integrated circuit device including a memory having a configuration suitable for mixture with logic Physics 24 Expired
US6778432B2 Thin film magnetic memory device capable of stably writing/reading data and method of fabricating the same Physics 16 Expired
US6535993B1 Testing apparatus for semiconductor memory device Physics 16 Expired
US6671213B2 Thin film magnetic memory device having redundancy repair function Physics 15 Expired
US6895537B2 Semiconductor integrated circuit device including semiconductor memory with tester circuit capable of analyzing redundancy repair Physics 15 Expired
US6765832B1 Semiconductor memory device with word line shift configuration Physics 14 Expired
US6625072B2 Semiconductor integrated circuit device provided with a self-testing circuit for carrying out an analysis for repair by using a redundant memory cell Physics 11 Expired
US6584005B1 Semiconductor memory device preventing erroneous writing in write operation and delay in read operation Physics 7 Expired
US6545921B2 Semiconductor memory device allowing spare memory cell to be tested efficiently Physics 6 Expired
US6157973A Microcomputer having memory and processor formed on the same chip to increase the rate of information transfer Physics 6 Expired
US6809969B2 Non-volatile semiconductor memory device capable of rapid operation Physics 2 Expired
US6888775B2 Semiconductor memory device for improvement of defective data line relief rate Physics 2 Expired
US6813188B2 Non-volatile semiconductor memory device having a memory cell which stably retains information Physics 2 Expired
US6891760B2 Method of erasing information in non-volatile semiconductor memory device Physics 2 Expired
US6744672B2 Non-volatile semiconductor memory device capable of high-speed data reading Electricity 1 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.