Ming He
22Patents
6h-index
41Co-inventors
65Inventor score
Filing activity: Mar 16, 2012 → Dec 17, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8586473B1 | Methods for fabricating integrated circuits with ruthenium-lined copper | Electricity | 36 | Active |
| US8517769B1 | Methods of forming copper-based conductive structures on an integrated circuit device | Electricity | 12 | Active |
| US9431294B2 | Methods of producing integrated circuits with an air gap | Electricity | 10 | Active |
| US9318437B1 | Moisture scavenging layer for thinner barrier application in beol integration | Electricity | 8 | Active |
| US8907483B2 | Semiconductor device having a self-forming barrier layer at via bottom | Electricity | 7 | Active |
| US8753975B1 | Methods of forming conductive copper-based structures using a copper-based nitride seed layer without a barrier layer and the resulting device | Electricity | 6 | Active |
| US10199270B2 | Multi-directional self-aligned multiple patterning | Electricity | 5 | Active |
| US9087881B2 | Electroless fill of trench in semiconductor structure | Electricity | 4 | Active |
| US8932934B2 | Methods of self-forming barrier integration with pore stuffed ULK material | Electricity | 4 | Active |
| US9691971B2 | Integrated circuits including magnetic tunnel junctions for magnetoresistive random-access memory and methods for fabricating the same | Electricity | 4 | Active |
| US8673766B2 | Methods of forming copper-based conductive structures by forming a copper-based seed layer having an as-deposited thickness profile and thereafter performing an etching process and electroless copper deposition | Electricity | 2 | Active |
| US10510675B2 | Substrate structure with spatial arrangement configured for coupling of surface plasmons to incident light | Electricity | 1 | Active |
| US9054052B2 | Methods for integration of pore stuffing material | Electricity | 1 | Active |
| US12356665B2 | Stacked transistors having an isolation region therebetween and a common gate electrode, and related fabrication methods | Electricity | 0 | Active |
| US11705363B2 | Fully aligned via integration with selective catalyzed vapor phase grown materials | Electricity | 0 | Active |
| US9165770B2 | Methods for fabricating integrated circuits using improved masks | Electricity | 0 | Active |
| US8859419B2 | Methods of forming copper-based nitride liner/passivation layers for conductive copper structures and the resulting device | Electricity | 0 | Active |
| US9576852B2 | Integrated circuits with self aligned contacts and methods of manufacturing the same | Electricity | 0 | Active |
| US9318436B2 | Copper based nitride liner passivation layers for conductive copper structures | Electricity | 0 | Active |
| USRE47630E1 | Semiconductor device having a self-forming barrier layer at via bottom | General | 0 | Active |
| USRE49820E1 | Semiconductor device having a self-forming barrier layer at via bottom | General | 0 | Active |
| US11978668B2 | Integrated circuit devices including a via and methods of forming the same | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.