Nui Chong
20Patents
4h-index
35Co-inventors
59Inventor score
Filing activity: Jan 29, 2004 → Dec 15, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10692837B1 | Chip package assembly with modular core dice | Electricity | 30 | Active |
| US8068004B1 | Embedded inductor | Emerging Cross-Sectional Technologies | 14 | Active |
| US7024646B2 | Electrostatic discharge simulation | Physics | 7 | Expired |
| US8194372B1 | Systems and methods for electrostatic discharge protection | Electricity | 4 | Active |
| US10629512B2 | Integrated circuit die with in-chip heat sink | Electricity | 4 | Active |
| US11054461B1 | Test circuits for testing a die stack | Electricity | 4 | Active |
| US7673270B1 | Method and apparatus for compensating an integrated circuit layout for mechanical stress effects | Physics | 4 | Active |
| US11119146B1 | Testing of bonded wafers and structures for testing bonded wafers | Electricity | 3 | Active |
| US7307319B1 | High-voltage protection device and process | Electricity | 2 | Expired |
| US11585854B1 | Runtime measurement of process variations and supply voltage characteristics | Electricity | 1 | Active |
| US11650249B1 | Wafer testing and structures for wafer testing | Physics | 1 | Active |
| US11164749B1 | Warpage reduction | Electricity | 1 | Active |
| US9177634B1 | Two gate pitch FPGA memory cell | Electricity | 1 | Active |
| US10043724B1 | Using an integrated circuit die for multiple devices | Electricity | 0 | Active |
| US10756711B1 | Integrated circuit skew determination | Electricity | 0 | Active |
| US12045469B2 | Single event upset tolerant memory device | Physics | 0 | Active |
| US11114344B1 | IC die with dummy structures | Electricity | 0 | Active |
| US10103139B2 | Method and design of low sheet resistance MEOL resistors | Electricity | 0 | Active |
| US10566050B1 | Selectively disconnecting a memory cell from a power supply | Physics | 0 | Active |
| US10379155B2 | In-die transistor characterization in an IC | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.