Ting-Sing Wang
20Patents
6h-index
14Co-inventors
66Inventor score
Filing activity: Jun 16, 1988 → Oct 28, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5037766A | Method of fabricating a thin film polysilicon thin film transistor or resistor | Emerging Cross-Sectional Technologies | 86 | Expired |
| US4917467A | Active matrix addressing arrangement for liquid crystal display | Physics | 22 | Expired |
| US6180980A | Trench non-volatile memory cell | Electricity | 22 | Expired |
| US6324097A | Single poly non-volatile memory structure and its fabricating method | Physics | 16 | Expired |
| US5824234A | Method for forming low contact resistance bonding pad | Electricity | 14 | Expired |
| US7456458B2 | Dynamic random access memory structure | Electricity | 9 | Expired |
| US5747378A | Method of damage free doping for forming a dram memory cell | Emerging Cross-Sectional Technologies | 5 | Expired |
| US5882984A | Method for increasing the refresh time of the DRAM | Electricity | 3 | Expired |
| US9129143B2 | Finger sensing structure for capacitive fingerprint recognition IC | Physics | 3 | Active |
| US6544847B2 | Single poly non-volatile memory structure and its fabricating method | Physics | 2 | Expired |
| US7622352B2 | Multi-step gate structure and method for preparing the same | Electricity | 1 | Active |
| US7319058B2 | Fabrication method of a non-volatile memory | Electricity | 1 | Expired |
| US6774394B2 | Inline detection device for self-aligned contact defects | Electricity | 1 | Expired |
| US9395801B2 | Finger detection device and method of fingerprint recognition integrated circuit | Emerging Cross-Sectional Technologies | 0 | Active |
| US7094697B2 | Method for preparing a deep trench and an etching mixture for the same | Electricity | 0 | Expired |
| US6010938A | Method for making a load resistor on a semiconductor chip | Electricity | 0 | Expired |
| US7557407B2 | Recessed gate structure and method for preparing the same | Electricity | 0 | Active |
| US6380072B2 | Metallizing process of semiconductor industry | Electricity | 0 | Expired |
| US6677608B2 | Semiconductor device for detecting gate defects | Electricity | 0 | Expired |
| US9715617B2 | Fingerprint sensor | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.