Inventor · Austin, TX, US

William S. Brennan

57Patents
17h-index
36Co-inventors
80Inventor score

Filing activity: Apr 17, 1996 → May 7, 2012

Most-cited inventions

PatentTitleAreaCited byStatus
US6955928B1 Closed loop residual gas analyzer process control technique Electricity 383 Expired
US5850105A Substantially planar semiconductor topography using dielectrics and chemical mechanical polish Electricity 261 Expired
US5953626A Dissolvable dielectric method Electricity 110 Expired
US5759913A Method of formation of an air gap within a semiconductor dielectric by solvent desorption Electricity 99 Expired
US5827776A Method of making an integrated circuit which uses an etch stop for producing staggered interconnect lines Electricity 79 Expired
US5792706A Interlevel dielectric with air gaps to reduce permitivity Electricity 63 Expired
US5783864A Multilevel interconnect structure of an integrated circuit having air gaps and pillars separating levels of interconnect Electricity 55 Expired
US5899727A Method of making a semiconductor isolation region bounded by a trench and covered with an oxide to improve planarization Electricity 45 Expired
US5814555A Interlevel dielectric with air gaps to lessen capacitive coupling Electricity 38 Expired
US5998293A Multilevel interconnect structure of an integrated circuit having air gaps and pillars separating levels of interconnect Electricity 37 Expired
US5926713A Method for achieving global planarization by forming minimum mesas in large field areas Electricity 36 Expired
US6208015A Interlevel dielectric with air gaps to lessen capacitive coupling Electricity 33 Expired
US5846876A Integrated circuit which uses a damascene process for producing staggered interconnect lines Electricity 28 Expired
US5926717A Method of making an integrated circuit with oxidizable trench liner Electricity 27 Expired
US6376330B1 Dielectric having an air gap formed between closely spaced interconnect lines Electricity 26 Expired
US6091149A Dissolvable dielectric method and structure Electricity 25 Expired
US6555479B1 Method for forming openings for conductive interconnects Electricity 18 Expired
US5783481A Semiconductor interlevel dielectric having a polymide for producing air gaps Electricity 17 Expired
US5717242A Integrated circuit having local interconnect for reduing signal cross coupled noise Electricity 16 Expired
US5767012A Method of forming a recessed interconnect structure Electricity 14 Expired
US5968843A Method of planarizing a semiconductor topography using multiple polish pads Electricity 14 Expired
US6255215A Semiconductor device having silicide layers formed using a collimated metal layer Electricity 11 Expired
US6060389A Semiconductor fabrication employing a conformal layer of CVD deposited TiN at the periphery of an interconnect Electricity 11 Expired
US5854131A Integrated circuit having horizontally and vertically offset interconnect lines Electricity 11 Expired
US6067855A Apparatus and method for measuring liquid level in a sealed container Physics 11 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.