Patent assignee · KR · COMPANY

DNF CO., LTD

26Patents
26Active
26Granted
50Portfolio score

Filing activity: Jun 4, 2014 → Feb 7, 2023

Most-cited patents

PatentTitleAreaCited byStatus
US9245740B2 Amino-silyl amine compound, method for preparing the same and silicon-containing thin-film using the same Electricity 10 Active
US9809608B2 Cyclodisilazane derivative, method for preparing the same and silicon-containing thin film using the same Electricity 4 Active
US10134583B2 Methods of forming a low-k dielectric layer and methods of fabricating a semiconductor device using the same Electricity 3 Active
US10224200B2 Aluminum compound, method of forming thin film by using the same, and method of fabricating integrated circuit device Electricity 2 Active
US11390635B2 Composition for depositing silicon-containing thin film and method for producing silicon-containing thin film using the same Chemistry; Metallurgy 2 Active
US9586979B2 Amino-silyl amine compound, method for preparing the same and silicon-containing thin-film using the same Chemistry; Metallurgy 2 Active
US10202407B2 Trisilyl amine derivative, method for preparing the same and silicon-containing thin film using the same Electricity 1 Active
US10214610B2 Polymer and composition containing same Chemistry; Metallurgy 1 Active
US10894799B2 Composition for depositing silicon-containing thin film including disilylamine compound and method for manufacturing silicon-containing thin film using the same Electricity 1 Active
US9916974B2 Amino-silyl amine compound and the manufacturing method of dielectric film containing Si—N bond by using atomic layer deposition Electricity 1 Active
US12384805B2 Iodine-containing metal compound and composition for depositing thin film including the same Chemistry; Metallurgy 0 Active
US11459653B2 Method for manufacturing molybdenum-containing thin film and molybdenum-containing thin film manufactured thereby Emerging Cross-Sectional Technologies 0 Active
US10361118B2 Organometallic precursors, methods of forming a layer using the same and methods of manufacturing semiconductor devices using the same Electricity 0 Active
US11827650B2 Method of manufacturing ruthenium-containing thin film and ruthenium-containing thin film manufactured therefrom Electricity 0 Active
US11749522B2 Composition for depositing silicon-containing thin film containing bis(aminosilyl)alkylamine compound and method for manufacturing silicon-containing thin using the same Electricity 0 Active
US11230492B2 Anti-glare glass and manufacturing method therefor Chemistry; Metallurgy 0 Active
US12398459B2 Silicon metal oxide encapsulation film comprising metal or metal oxide in thin film, and manufacturing method therefor Chemistry; Metallurgy 0 Active
US11901191B2 Atomic layer etching method and semiconductor device manufacturing method using the same Electricity 0 Active
US11358974B2 Silylamine compound, composition for depositing silicon-containing thin film containing the same, and method for manufacturing silicon-containing thin film using the composition Chemistry; Metallurgy 0 Active
US10913755B2 Transition metal compound, preparation method therefor, and composition for depositing transition metal-containing thin film, containing same Chemistry; Metallurgy 0 Active
US11393676B2 Composition for depositing silicon-containing thin film containing bis(aminosilyl)alkylamine compound and method for manufacturing silicon-containing thin film using the same Electricity 0 Active
US10882873B2 Method of forming tin-containing material film and method of synthesizing a tin compound Chemistry; Metallurgy 0 Active
US11062940B2 Organometallic precursors, methods of forming a layer using the same and methods of manufacturing semiconductor devices using the same Electricity 0 Active
US12304924B2 Silylcyclodisilazane compound and method for manufacturing silicon-containing thin film using the same Chemistry; Metallurgy 0 Active
US11319333B2 Disilylamine compound, method for preparing the same, and composition for depositing silicon-containing thin film including the same Chemistry; Metallurgy 0 Active

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.