Christian Dussarrat
89Patents
12h-index
58Co-inventors
83Inventor score
Filing activity: Nov 27, 2002 → Sep 30, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8668957B2 | Method of forming dielectric films, new precursors and their use in semiconductor manufacturing | Electricity | 518 | Active |
| US8227032B2 | Method of forming silicon oxide containing films | Electricity | 453 | Active |
| US7192626B2 | Methods for producing silicon nitride films and silicon oxynitride films by thermal chemical vapor deposition | Electricity | 75 | Expired |
| US7019159B2 | Hexakis(monohydrocarbylamino) disilanes and method for the preparation thereof | Chemistry; Metallurgy | 53 | Expired |
| US7482286B2 | Method for forming dielectric or metallic films | Emerging Cross-Sectional Technologies | 34 | Expired |
| US6936548B2 | Method for depositing silicon nitride films and silicon oxynitride films by chemical vapor deposition | Chemistry; Metallurgy | 30 | Expired |
| US7064083B2 | Hexakis(monohydrocarbylamino)disilanes and method for the preparation thereof | Chemistry; Metallurgy | 26 | Expired |
| US9371338B2 | Organosilane precursors for ALD/CVD silicon-containing film applications | Electricity | 20 | Active |
| US8357430B2 | Method for producing silicon nitride films | Electricity | 18 | Active |
| US8853075B2 | Method for forming a titanium-containing layer on a substrate using an atomic layer deposition (ALD) process | Electricity | 14 | Active |
| US8399056B2 | Method of forming high-k dielectric films based on novel titanium, zirconium, and hafnium precursors and their use for semiconductor manufacturing | Electricity | 12 | Active |
| US9911590B2 | Methods of forming dielectric films, new precursors and their use in semiconductor manufacturing | Electricity | 12 | Active |
| US9514959B2 | Fluorocarbon molecules for high aspect ratio oxide etch | Chemistry; Metallurgy | 12 | Active |
| US10094021B2 | Group 6 transition metal-containing compounds for vapor deposition of group 6 transition metal-containing films | Chemistry; Metallurgy | 11 | Active |
| US8470402B2 | Method of depositing a metal-containing dielectric film | Electricity | 9 | Active |
| US8454928B2 | Tellurium precursors for GST deposition | Electricity | 9 | Active |
| US8283201B2 | Preparation of lanthanide-containing precursors and deposition of lanthanide-containing films | Chemistry; Metallurgy | 8 | Active |
| US8092721B2 | Deposition of ternary oxide films containing ruthenium and alkali earth metals | Chemistry; Metallurgy | 7 | Active |
| US8153832B2 | Pentakis(dimethylamino) disilane precursor comprising compound and method for the preparation thereof | Chemistry; Metallurgy | 6 | Active |
| US8377511B2 | Method for depositing silicon nitride films and/or silicon oxynitride films by chemical vapor deposition | Chemistry; Metallurgy | 5 | Active |
| US7972975B2 | Method for forming a dielectric film and novel precursors for implementing said method | Electricity | 5 | Active |
| US7951711B2 | Metal precursors for semiconductor applications | Chemistry; Metallurgy | 5 | Active |
| US8617649B2 | Cyclopentadienyl transition metal precursors for deposition of transition metal-containing films | Chemistry; Metallurgy | 4 | Active |
| US7544389B2 | Precursor for film formation and method for forming ruthenium-containing film | Electricity | 4 | Expired |
| US8404878B2 | Titanium-containing precursors for vapor deposition | Electricity | 4 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.