Hans-Peter Feuerbaum
43Patents
17h-index
28Co-inventors
81Inventor score
Filing activity: Aug 10, 1978 → Apr 3, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7045781B2 | Charged particle beam apparatus and method for operating the same | Electricity | 179 | Expired |
| US7274018B2 | Charged particle beam apparatus and method for operating the same | Electricity | 160 | Expired |
| US6943349B2 | Multi beam charged particle device | Electricity | 89 | Expired |
| US4831266A | Detector objective for particle beam apparatus | Electricity | 43 | Expired |
| US4277679A | Apparatus and method for contact-free potential measurements of an electronic composition | Electricity | 33 | Expired |
| US4713543A | Scanning particle microscope | Electricity | 28 | Expired |
| US5422486A | Scanning electron beam device | Electricity | 28 | Expired |
| US4220854A | Method for the contactless measurement of the potential waveform in an electronic component and apparatus for implementing the method | Physics | 27 | Expired |
| US4296372A | Techniques for impressing a voltage with an electron beam | Physics | 27 | Expired |
| US4812651A | Spectrometer objective for particle beam measuring instruments | Electricity | 26 | Expired |
| US4220853A | Method for the contactless measurement of the potential waveform in an electronic component and arrangement for implementing the method | Physics | 25 | Expired |
| US6730907B1 | Charged particle device | Electricity | 22 | Expired |
| US5780859A | Electrostatic-magnetic lens arrangement | Electricity | 20 | Expired |
| US4413181A | Arrangement for stroboscopic potential measurements with an electron beam testing device | Electricity | 20 | Expired |
| US4223220A | Method for electronically imaging the potential distribution in an electronic component and arrangement for implementing the method | Physics | 19 | Expired |
| US5834773A | Method and apparatus for testing the function of microstructure elements | Physics | 19 | Expired |
| US6555815B2 | Apparatus and method for examining specimen with a charged particle beam | Electricity | 19 | Expired |
| US4241259A | Scanning electron microscope | Electricity | 17 | Expired |
| US4292519A | Device for contact-free potential measurements | Electricity | 17 | Expired |
| US8203119B2 | Charged particle beam device with retarding field analyzer | Electricity | 17 | Active |
| US6936817B2 | Optical column for charged particle beam device | Electricity | 15 | Expired |
| US5329125A | Device for corpuscular-optical examination and/or processing of material samples | Electricity | 15 | Expired |
| US4169229A | Apparatus for keying in electron beams | Electricity | 14 | Expired |
| US4460866A | Method for measuring resistances and capacitances of electronic components | Physics | 14 | Expired |
| US5041724A | Method of operating an electron beam measuring device | Electricity | 13 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.