Hsing-Lien Lin
110Patents
8h-index
52Co-inventors
83Inventor score
Filing activity: Jul 29, 1999 → Mar 13, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6180503A | Passivation layer etching process for memory arrays with fusible links | Electricity | 51 | Expired |
| US9431609B2 | Oxide film scheme for RRAM structure | Electricity | 22 | Active |
| US10164182B1 | Switching layer scheme to enhance RRAM performance | Electricity | 18 | Active |
| US9954166B1 | Embedded memory device with a composite top electrode | Electricity | 18 | Active |
| US9257642B1 | Protective sidewall techniques for RRAM | Electricity | 13 | Active |
| US10176866B1 | Recap layer scheme to enhance RRAM performance | Physics | 11 | Active |
| US9577191B2 | RRAM cell bottom electrode formation | Electricity | 8 | Active |
| US9847401B2 | Semiconductor device and method of forming the same | Electricity | 8 | Active |
| US9978938B2 | Resistive RAM structure and method of fabrication thereof | Electricity | 8 | Active |
| US9647207B2 | Resistive random access memory (RRAM) structure | Electricity | 8 | Active |
| US9627613B2 | Resistive random access memory (RRAM) cell with a composite capping layer | Electricity | 7 | Active |
| US10193065B2 | High K scheme to improve retention performance of resistive random access memory (RRAM) | Electricity | 6 | Active |
| US9418999B2 | MIM capacitors with improved reliability | Electricity | 6 | Active |
| US9484537B2 | Organic photo diode with dual electron blocking layers | Emerging Cross-Sectional Technologies | 5 | Active |
| US7199001B2 | Method of forming MIM capacitor electrodes | Electricity | 5 | Expired |
| US9960353B2 | Method of fabricating an organic photodiode with dual electron blocking layers | Emerging Cross-Sectional Technologies | 4 | Active |
| US10622555B2 | Film scheme to improve peeling in chalcogenide based PCRAM | Emerging Cross-Sectional Technologies | 4 | Active |
| US7529078B2 | Low tunneling current MIM structure and method of manufacturing same | Electricity | 4 | Active |
| US9728597B2 | Metal-insulator-metal structure and method for forming the same | Electricity | 4 | Active |
| US9543375B2 | MIM/RRAM structure with improved capacitance and reduced leakage current | Electricity | 4 | Active |
| US10505107B2 | Switching layer scheme to enhance RRAM performance | Electricity | 4 | Active |
| US10910560B2 | RRAM structure | Electricity | 4 | Active |
| US9450183B2 | Memory structure having top electrode with protrusion | Electricity | 4 | Active |
| US9825117B2 | MIM/RRAM structure with improved capacitance and reduced leakage current | Electricity | 3 | Active |
| US9425240B2 | Image sensors with organic photodiodes and methods for forming the same | Electricity | 3 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.