Isaac Lauer
190Patents
14h-index
61Co-inventors
85Inventor score
Filing activity: Sep 10, 2007 → Sep 6, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8669615B1 | Techniques for metal gate workfunction engineering to enable multiple threshold voltage FINFET devices | Electricity | 43 | Active |
| US8809131B2 | Replacement gate fin first wire last gate all around devices | Electricity | 38 | Active |
| US9755017B1 | Co-integration of silicon and silicon-germanium channels for nanosheet devices | Electricity | 35 | Active |
| US8173993B2 | Gate-all-around nanowire tunnel field effect transistors | Electricity | 31 | Active |
| US9647139B2 | Atomic layer deposition sealing integration for nanosheet complementary metal oxide semiconductor with replacement spacer | Electricity | 28 | Active |
| US8658518B1 | Techniques for metal gate work function engineering to enable multiple threshold voltage nanowire FET devices | Performing Operations; Transporting | 27 | Active |
| US8716091B2 | Structure for self-aligned silicide contacts to an upside-down FET by epitaxial source and drain | Electricity | 26 | Active |
| US8785981B1 | Non-replacement gate nanomesh field effect transistor with pad regions | Electricity | 26 | Active |
| US9748404B1 | Method for fabricating a semiconductor device including gate-to-bulk substrate isolation | Electricity | 22 | Active |
| US8178400B2 | Replacement spacer for tunnel FETs | Electricity | 18 | Active |
| US8928083B2 | Diode structure and method for FINFET technologies | Electricity | 18 | Active |
| US9209095B2 | III-V, Ge, or SiGe fin base lateral bipolar transistor structure and method | Electricity | 16 | Active |
| US8900959B2 | Non-replacement gate nanomesh field effect transistor with pad regions | Electricity | 15 | Active |
| US9653547B1 | Integrated etch stop for capped gate and method for manufacturing the same | Electricity | 15 | Active |
| US8258031B2 | Fabrication of a vertical heterojunction tunnel-FET | Electricity | 14 | Active |
| US8669167B1 | Techniques for metal gate workfunction engineering to enable multiple threshold voltage FINFET devices | Electricity | 14 | Active |
| US8673731B2 | Techniques for gate workfunction engineering to reduce short channel effects in planar CMOS devices | Electricity | 14 | Active |
| US8324030B2 | Nanowire tunnel field effect transistors | Electricity | 13 | Active |
| US9006087B2 | Diode structure and method for wire-last nanomesh technologies | Emerging Cross-Sectional Technologies | 12 | Active |
| US8969145B2 | Wire-last integration method and structure for III-V nanowire devices | Emerging Cross-Sectional Technologies | 12 | Active |
| US8927397B2 | Diode structure and method for gate all around silicon nanowire technologies | Emerging Cross-Sectional Technologies | 12 | Active |
| US8802527B1 | Gate electrode optimized for low voltage operation | Electricity | 11 | Active |
| US9391163B2 | Stacked planar double-gate lamellar field-effect transistor | Electricity | 11 | Active |
| US8659084B1 | Techniques for gate workfunction engineering to reduce short channel effects in planar CMOS devices | Electricity | 11 | Active |
| US9911592B2 | Method for making nanosheet CMOS device integrating atomic layer deposition process and replacement gate structure | Electricity | 10 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.