Mohan Dunga
60Patents
13h-index
56Co-inventors
83Inventor score
Filing activity: Sep 19, 2008 → Apr 15, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7755946B2 | Data state-based temperature compensation during sensing in non-volatile memory | Physics | 43 | Active |
| US9972396B1 | System and method for programming a memory device with multiple writes without an intervening erase | Physics | 35 | Active |
| US9202579B2 | Compensation for temperature dependence of bit line resistance | Physics | 27 | Active |
| US9935050B2 | Multi-tier three-dimensional memory devices including vertically shared source lines and method of making thereof | Electricity | 24 | Active |
| US9543028B2 | Word line dependent temperature compensation scheme during sensing to counteract cross-temperature effect | Physics | 24 | Active |
| US8988939B2 | Pre-charge during programming for 3D memory using gate-induced drain leakage | Physics | 23 | Active |
| US10115459B1 | Multiple liner interconnects for three dimensional memory devices and method of making thereof | Physics | 23 | Active |
| US10319680B1 | Metal contact via structure surrounded by an air gap and method of making thereof | Electricity | 17 | Active |
| US10008273B2 | Cell current based bit line voltage | Physics | 17 | Active |
| US9711231B1 | System solution for first read issue using time dependent read voltages | Physics | 16 | Active |
| US8988937B2 | Pre-charge during programming for 3D memory using gate-induced drain leakage | Physics | 16 | Active |
| US9142305B2 | System to reduce stress on word line select transistor during erase operation | Physics | 14 | Active |
| US8861282B2 | Method and apparatus for program and erase of select gate transistors | Electricity | 13 | Active |
| US9704588B1 | Apparatus and method for preconditioning currents to reduce errors in sensing for non-volatile memory | Physics | 12 | Active |
| US7974133B2 | Robust sensing circuit and method | Physics | 11 | Active |
| US9082502B2 | Bit line and compare voltage modulation for sensing nonvolatile storage elements | Physics | 10 | Active |
| US9368222B2 | Bit line pre-charge with current reduction | Electricity | 8 | Active |
| US9564226B1 | Smart verify for programming non-volatile memory | Physics | 8 | Active |
| US10304551B2 | Erase speed based word line control | Physics | 7 | Active |
| US10971240B1 | Wordline smart tracking verify | Physics | 6 | Active |
| US9443597B2 | Controlling dummy word line bias during erase in non-volatile memory | Physics | 5 | Active |
| US10643695B1 | Concurrent multi-state program verify for non-volatile memory | Physics | 5 | Active |
| US9159406B2 | Single-level cell endurance improvement with pre-defined blocks | Physics | 5 | Active |
| US10541031B2 | Single pulse SLC programming scheme | Physics | 5 | Active |
| US10559370B2 | System and method for in-situ programming and read operation adjustments in a non-volatile memory | Physics | 4 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.