Sanjay C. Mehta
122Patents
11h-index
118Co-inventors
83Inventor score
Filing activity: Oct 1, 2003 → Apr 7, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10418277B2 | Air gap spacer formation for nano-scale semiconductor devices | Electricity | 136 | Active |
| US9773901B1 | Bottom spacer formation for vertical transistor | Electricity | 29 | Active |
| US9892961B1 | Air gap spacer formation for nano-scale semiconductor devices | Electricity | 27 | Active |
| US7517736B2 | Structure and method of chemically formed anchored metallic vias | Electricity | 25 | Active |
| US9397049B1 | Gate tie-down enablement with inner spacer | Electricity | 15 | Active |
| US9356121B2 | Divot-free planarization dielectric layer for replacement gate | Electricity | 13 | Active |
| US8900973B2 | Method to enable compressively strained pFET channel in a FinFET structure by implant and thermal diffusion | Electricity | 12 | Active |
| US7838428B2 | Method of repairing process induced dielectric damage by the use of GCIB surface treatment using gas clusters of organic molecular species | Electricity | 12 | Active |
| US7253105B2 | Reliable BEOL integration process with direct CMP of porous SiCOH dielectric | Electricity | 12 | Expired |
| US9748359B1 | Vertical transistor bottom spacer formation | Electricity | 11 | Active |
| US8617961B1 | Post-gate isolation area formation for fin field effect transistor device | Electricity | 11 | Active |
| US8835237B2 | Robust replacement gate integration | Electricity | 10 | Active |
| US8394684B2 | Structure and method for stress latching in non-planar semiconductor devices | Electricity | 10 | Active |
| US8486778B2 | Low resistance source and drain extensions for ETSOI | Electricity | 9 | Active |
| US10256320B1 | Vertical field-effect-transistors having a silicon oxide layer with controlled thickness | Electricity | 9 | Active |
| US9171927B2 | Spacer replacement for replacement metal gate semiconductor devices | Electricity | 9 | Active |
| US8440552B1 | Method to form low series resistance transistor devices on silicon on insulator layer | Electricity | 8 | Active |
| US8829617B2 | Uniform finFET gate height | Electricity | 8 | Active |
| US9941391B2 | Method of forming vertical transistor having dual bottom spacers | Electricity | 8 | Active |
| US9954103B1 | Bottom spacer formation for vertical transistor | Electricity | 8 | Active |
| US10079299B2 | Self aligned top extension formation for vertical transistors | Electricity | 8 | Active |
| US7294565B2 | Method of fabricating a wire bond pad with Ni/Au metallization | Electricity | 8 | Expired |
| US9748382B1 | Self aligned top extension formation for vertical transistors | Electricity | 8 | Active |
| US9472407B2 | Replacement metal gate FinFET | Electricity | 7 | Active |
| US9583489B1 | Solid state diffusion doping for bulk finFET devices | Electricity | 7 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.