Jae-Won Han
42Patents
6h-index
18Co-inventors
66Inventor score
Filing activity: Nov 24, 1998 → Dec 4, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7745250B2 | Image sensor and method for manufacturing the same | Electricity | 210 | Active |
| US8593415B2 | Method for processing touch signal in mobile terminal and mobile terminal using the same | Physics | 123 | Active |
| US6821877B1 | Method of fabricating metal interconnection of semiconductor device | Electricity | 17 | Expired |
| US7727807B2 | Semiconductor device | Electricity | 10 | Active |
| US6132081A | Method for calibrating optical sensor used to measure the temperature of a substrate during rapid thermal process | Electricity | 6 | Expired |
| US6207562A | Method of forming titanium silicide | Electricity | 6 | Expired |
| US7598583B2 | Image sensor | Electricity | 3 | Active |
| US6903026B2 | Sputter etch methods | Electricity | 3 | Expired |
| US7528070B2 | Sputtering apparatus and method for forming metal silicide layer using the same | Electricity | 2 | Active |
| US7030021B2 | Method of fabricating metal interconnection of semiconductor device | Electricity | 2 | Expired |
| US7312147B2 | Method of forming barrier metal in semiconductor device | Electricity | 2 | Expired |
| US7541279B2 | Method for manufacturing semiconductor device | Electricity | 2 | Active |
| US7494921B2 | Aluminum metal line of a semiconductor device and method of fabricating the same | Electricity | 2 | Active |
| US7122388B2 | Method of detecting misalignment of ion implantation area | Electricity | 2 | Expired |
| US7790605B2 | Formation of interconnects through lift-off processing | Emerging Cross-Sectional Technologies | 1 | Active |
| US7880292B2 | Semiconductor device and fabricating method thereof | Electricity | 1 | Active |
| US7060603B2 | Methods of forming metal wiring of semiconductor devices including sintering the wiring layers and forming a via hole with a barrier metal | Electricity | 1 | Expired |
| US7767481B2 | Image sensor and method for manufacturing the same | Electricity | 1 | Active |
| US7368749B2 | Method of detecting misalignment of ion implantation area | Electricity | 1 | Active |
| US7683489B2 | Semiconductor device and fabricating method thereof | Electricity | 1 | Active |
| US7141880B2 | Metal line stacking structure in semiconductor device and formation method thereof | Electricity | 1 | Expired |
| US10713137B2 | Memory module | Physics | 1 | Active |
| US6923710B2 | Apparatus and method for chemical mechanical polishing process | Performing Operations; Transporting | 1 | Expired |
| US7743482B2 | Fabricating method of a semiconductor device | Emerging Cross-Sectional Technologies | 0 | Active |
| US11875751B2 | Display device with intra-interface for simple signal transmittal path | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.