Inventor · Tangxia, CN

Peng Chen

29Patents
3h-index
45Co-inventors
63Inventor score

Filing activity: May 8, 2003 → May 30, 2024

Most-cited inventions

PatentTitleAreaCited byStatus
US6841274B2 GaN single-crystal substrate, nitride type semiconductor epitaxial substrate, nitride type semiconductor device, and methods of making the same Electricity 20 Expired
US7910937B2 Method and structure for fabricating III-V nitride layers on silicon substrates Electricity 20 Expired
US10304178B2 Method and system for diagnosing a semiconductor wafer Physics 5 Active
US10325881B2 Vertical semiconductor device having a stacked die block Electricity 3 Active
US8458631B2 Cycle time reduction in data preparation Physics 3 Active
US11600505B2 Systems and methods for systematic physical failure analysis (PFA) fault localization Electricity 2 Active
US9360192B2 LED illuminating device Mechanical Engineering; Lighting; Heating 2 Active
US8120012B2 Group III nitride white light emitting diode Electricity 2 Active
US8650511B2 Lithography performance check methods and apparatus Physics 1 Active
US12027396B2 Systems and methods for systematic physical failure analysis (PFA) fault localization Electricity 1 Active
US8555211B2 Mask making with error recognition Physics 1 Active
US12021050B2 Semiconductor device Electricity 1 Active
US9136092B2 Structure and method for E-beam writing Electricity 0 Active
US11961939B2 Method of manufacturing a light-emitting device Electricity 0 Active
US11398583B2 Light-emitting device Electricity 0 Active
US10762621B2 Semiconductor wafer measurement method and system Physics 0 Active
US10001262B2 LED retrofit lamp and process for manufacturing the same Emerging Cross-Sectional Technologies 0 Active
US12400987B2 Semiconductor device Electricity 0 Active
US7571421B2 System, method, and computer-readable medium for performing data preparation for a mask design Physics 0 Active
US10102615B2 Method and system for detecting hotspots in semiconductor wafer Electricity 0 Active
US11469198B2 Semiconductor device manufacturing method and associated semiconductor die Electricity 0 Active
US8237174B2 LED structure Electricity 0 Active
US11669957B2 Semiconductor wafer measurement method and system Physics 0 Active
US10371359B2 Retaining structure for a light engine Emerging Cross-Sectional Technologies 0 Active
US11094057B2 Semiconductor wafer measurement method and system Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.