Steven Bentley
81Patents
17h-index
79Co-inventors
83Inventor score
Filing activity: Feb 1, 2013 → Mar 25, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9530866B1 | Methods of forming vertical transistor devices with self-aligned top source/drain conductive contacts | Electricity | 93 | Active |
| US9947804B1 | Methods of forming nanosheet transistor with dielectric isolation of source-drain regions and related structure | Electricity | 91 | Active |
| US10192867B1 | Complementary FETs with wrap around contacts and method of forming same | Electricity | 82 | Active |
| US9640636B1 | Methods of forming replacement gate structures and bottom and top source/drain regions on a vertical transistor device | Electricity | 66 | Active |
| US9536793B1 | Self-aligned gate-first VFETs using a gate spacer recess | Electricity | 61 | Active |
| US9773708B1 | Devices and methods of forming VFET with self-aligned replacement metal gates aligned to top spacer post top source drain EPI | Electricity | 57 | Active |
| US9991352B1 | Methods of forming a nano-sheet transistor device with a thicker gate stack and the resulting device | Electricity | 54 | Active |
| US10510620B1 | Work function metal patterning for N-P space between active nanostructures | Electricity | 54 | Active |
| US9530863B1 | Methods of forming vertical transistor devices with self-aligned replacement gate structures | Electricity | 54 | Active |
| US8716156B1 | Methods of forming fins for a FinFET semiconductor device using a mandrel oxidation process | Electricity | 44 | Active |
| US10256158B1 | Insulated epitaxial structures in nanosheet complementary field effect transistors | Electricity | 39 | Active |
| US9972494B1 | Method and structure to control channel length in vertical FET device | Electricity | 31 | Active |
| US9825032B1 | Metal layer routing level for vertical FET SRAM and logic cell scaling | Electricity | 28 | Active |
| US10236292B1 | Complementary FETs with wrap around contacts and methods of forming same | Electricity | 22 | Active |
| US9165837B1 | Method to form defect free replacement fins by H2 anneal | Electricity | 20 | Active |
| US9799751B1 | Methods of forming a gate structure on a vertical transistor device | Electricity | 19 | Active |
| US9178036B1 | Methods of forming transistor devices with different threshold voltages and the resulting products | Electricity | 19 | Active |
| US9805988B1 | Method of forming semiconductor structure including suspended semiconductor layer and resulting structure | Electricity | 15 | Active |
| US10217846B1 | Vertical field effect transistor formation with critical dimension control | Electricity | 14 | Active |
| US9748335B1 | Method, apparatus and system for improved nanowire/nanosheet spacers | Electricity | 12 | Active |
| US10157794B1 | Integrated circuit structure with stepped epitaxial region | Electricity | 11 | Active |
| US10056377B2 | Metal layer routing level for vertical FET SRAM and logic cell scaling | Electricity | 9 | Active |
| US9966456B1 | Methods of forming gate electrodes on a vertical transistor device | Electricity | 8 | Active |
| US11201152B2 | Method, apparatus, and system for fin-over-nanosheet complementary field-effect-transistor | Electricity | 8 | Active |
| US10141414B1 | Negative capacitance matching in gate electrode structures | Electricity | 8 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.