Van H. Le
251Patents
11h-index
158Co-inventors
79Inventor score
Filing activity: Sep 24, 2010 → Feb 16, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9123567B2 | CMOS implementation of germanium and III-V nanowires and nanoribbons in gate-all-around architecture | Electricity | 57 | Active |
| US8987794B2 | Non-planar gate all-around device and method of fabrication thereof | Electricity | 54 | Active |
| US8765563B2 | Trench confined epitaxially grown device layer(s) | Electricity | 34 | Active |
| US8748940B1 | Semiconductor devices with germanium-rich active layers and doped transition layers | Emerging Cross-Sectional Technologies | 28 | Active |
| US9123790B2 | Contact techniques and configurations for reducing parasitic resistance in nanowire transistors | Emerging Cross-Sectional Technologies | 20 | Active |
| US10763349B2 | Quantum dot devices with modulation doped stacks | Electricity | 18 | Active |
| US8575653B2 | Non-planar quantum well device having interfacial layer and method of forming same | Electricity | 17 | Active |
| US9590089B2 | Variable gate width for gate all-around transistors | Emerging Cross-Sectional Technologies | 14 | Active |
| US8785907B2 | Epitaxial film growth on patterned substrate | Electricity | 12 | Active |
| US9634007B2 | Trench confined epitaxially grown device layer(s) | Electricity | 12 | Active |
| US9570614B2 | Ge and III-V channel semiconductor devices having maximized compliance and free surface relaxation | Electricity | 11 | Active |
| US9472613B2 | Conversion of strain-inducing buffer to electrical insulator | Electricity | 11 | Active |
| US8872225B2 | Defect transferred and lattice mismatched epitaxial film | Electricity | 10 | Active |
| US9391181B2 | Lattice mismatched hetero-epitaxial film | Electricity | 9 | Active |
| US9129827B2 | Conversion of strain-inducing buffer to electrical insulator | Electricity | 9 | Active |
| US9029835B2 | Epitaxial film on nanoscale structure | Electricity | 9 | Active |
| US10038054B2 | Variable gate width for gate all-around transistors | Emerging Cross-Sectional Technologies | 9 | Active |
| US9136343B2 | Deep gate-all-around semiconductor device having germanium or group III-V active layer | Electricity | 9 | Active |
| US8710490B2 | Semiconductor device having germanium active layer with underlying parasitic leakage barrier layer | Electricity | 8 | Active |
| US9337291B2 | Deep gate-all-around semiconductor device having germanium or group III-V active layer | Electricity | 8 | Active |
| US9691843B2 | Common-substrate semiconductor devices having nanowires or semiconductor bodies with differing material orientation or composition | Electricity | 7 | Active |
| US11171243B2 | Transistor structures with a metal oxide contact buffer | Electricity | 7 | Active |
| US10096709B2 | Aspect ratio trapping (ART) for fabricating vertical semiconductor devices | Electricity | 6 | Active |
| US10418487B2 | Non-planar gate all-around device and method of fabrication thereof | Electricity | 6 | Active |
| US10693008B2 | Cladding layer epitaxy via template engineering for heterogeneous integration on silicon | Electricity | 6 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.