Yu Lu
31Patents
11h-index
19Co-inventors
61Inventor score
Filing activity: Dec 17, 2013 → Nov 21, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9343659B1 | Embedded magnetoresistive random access memory (MRAM) integration with top contacts | Electricity | 39 | Active |
| US10043967B2 | Self-compensation of stray field of perpendicular magnetic elements | Electricity | 36 | Active |
| US9142762B1 | Magnetic tunnel junction and method for fabricating a magnetic tunnel junction | Electricity | 23 | Active |
| US9437272B1 | Multi-bit spin torque transfer magnetoresistive random access memory with sub-arrays | Physics | 23 | Active |
| US9704919B1 | High aspect ratio vertical interconnect access (via) interconnections in magnetic random access memory (MRAM) bit cells | Electricity | 22 | Active |
| US9269893B2 | Replacement conductive hard mask for multi-step magnetic tunnel junction (MTJ) etch | Electricity | 17 | Active |
| US9406875B2 | MRAM integration techniques for technology scaling | Electricity | 16 | Active |
| US9576801B2 | High dielectric constant/metal gate (HK/MG) compatible floating gate (FG)/ferroelectric dipole non-volatile memory | Electricity | 15 | Active |
| US9614143B2 | De-integrated trench formation for advanced MRAM integration | Electricity | 12 | Active |
| US9362336B2 | Sub-lithographic patterning of magnetic tunneling junction devices | Electricity | 12 | Active |
| US9461094B2 | Switching film structure for magnetic random access memory (MRAM) cell | Physics | 11 | Active |
| US9496314B1 | Shared source line magnetic tunnel junction (MTJ) bit cells employing uniform MTJ connection patterns for reduced area | Electricity | 8 | Active |
| US9595662B2 | MRAM integration techniques for technology scaling | Electricity | 8 | Active |
| US9318696B2 | Self-aligned top contact for MRAM fabrication | Electricity | 5 | Active |
| US9548096B1 | Reverse complement magnetic tunnel junction (MTJ) bit cells employing shared source lines, and related methods | Electricity | 5 | Active |
| US9865798B2 | Electrode structure for resistive memory device | Electricity | 4 | Active |
| US10008537B2 | Complementary magnetic tunnel junction (MTJ) bit cell with shared bit line | Electricity | 4 | Active |
| US9490424B2 | Sub-lithographic patterning of magnetic tunneling junction devices | Electricity | 4 | Active |
| US9548333B2 | MRAM integration with low-K inter-metal dielectric for reduced parasitic capacitance | Electricity | 4 | Active |
| US9508439B2 | Non-volatile multiple time programmable memory device | Electricity | 3 | Active |
| US9728718B2 | Magnetic tunnel junction (MTJ) device array | Electricity | 3 | Active |
| US9647037B2 | Resistive random access memory device with resistance-based storage element and method of fabricating same | Electricity | 3 | Active |
| US9666792B2 | Shadow-effect compensated fabrication of magnetic tunnel junction (MTJ) elements | Electricity | 3 | Active |
| US10109674B2 | Semiconductor metallization structure | Electricity | 2 | Active |
| US9721634B2 | Decoupling of source line layout from access transistor contact placement in a magnetic tunnel junction (MTJ) memory bit cell to facilitate reduced contact resistance | Electricity | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.