Benjamin Colombeau
48Patents
4h-index
81Co-inventors
62Inventor score
Filing activity: Sep 27, 2007 → Oct 18, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8053340B2 | Method for fabricating semiconductor devices with reduced junction diffusion | Electricity | 97 | Active |
| US9853129B2 | Forming non-line-of-sight source drain extension in an nMOS finFET using n-doped selective epitaxial growth | Electricity | 17 | Active |
| US9460920B1 | Horizontal gate all around device isolation | Electricity | 11 | Active |
| US9396902B2 | Gallium ION source and materials therefore | Electricity | 8 | Active |
| US9865735B2 | Horizontal gate all around and FinFET device isolation | Electricity | 4 | Active |
| US8354321B2 | Method for fabricating semiconductor devices with reduced junction diffusion | Electricity | 4 | Active |
| US8722431B2 | FinFET device fabrication using thermal implantation | Electricity | 4 | Active |
| US8999800B2 | Method of reducing contact resistance | Electricity | 4 | Active |
| US10861722B2 | Integrated semiconductor processing | Electricity | 3 | Active |
| US10573719B2 | Horizontal gate all around device isolation | Electricity | 2 | Active |
| US9455196B2 | Method for improving fin isolation | Electricity | 2 | Active |
| US10381465B2 | Method for fabricating asymmetrical three dimensional device | Electricity | 2 | Active |
| US8860142B2 | Method and apparatus to reduce thermal variations within an integrated circuit die using thermal proximity correction | Electricity | 2 | Active |
| US9748364B2 | Method for fabricating three dimensional device | Electricity | 1 | Active |
| US11309404B2 | Integrated CMOS source drain formation with advanced control | Electricity | 1 | Active |
| US8012843B2 | Optimized halo or pocket cold implants | Electricity | 1 | Active |
| US10490666B2 | Horizontal gate all around and FinFET device isolation | Electricity | 1 | Active |
| US10347462B2 | Imaging of crystalline defects | Electricity | 1 | Active |
| US11393916B2 | Methods for GAA I/O formation by selective epi regrowth | Electricity | 1 | Active |
| US12027607B2 | Methods for GAA I/O formation by selective epi regrowth | Electricity | 1 | Active |
| US9337314B2 | Technique for selectively processing three dimensional device | Electricity | 0 | Active |
| US12261047B2 | Doping techniques | Electricity | 0 | Active |
| US10629752B1 | Gate all-around device | Electricity | 0 | Active |
| US11495500B2 | Horizontal GAA nano-wire and nano-slab transistors | Electricity | 0 | Active |
| US10483355B2 | Forming non-line-of-sight source drain extension in an NMOS FINFET using n-doped selective epitaxial growth | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.