John Pipitone
28Patents
7h-index
23Co-inventors
65Inventor score
Filing activity: Feb 3, 2005 → Jul 18, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7768269B2 | Method of multi-location ARC sensing with adaptive threshold comparison | Electricity | 35 | Active |
| US7737702B2 | Apparatus for wafer level arc detection at an electrostatic chuck electrode | Electricity | 32 | Active |
| US8070925B2 | Physical vapor deposition reactor with circularly symmetric RF feed and DC feed to the sputter target | Electricity | 32 | Active |
| US8491759B2 | RF impedance matching network with secondary frequency and sub-harmonic variant | Electricity | 28 | Active |
| US7244344B2 | Physical vapor deposition plasma reactor with VHF source power applied through the workpiece | Electricity | 21 | Expired |
| US7214619B2 | Method for forming a barrier layer in an integrated circuit in a plasma with source and bias power frequencies applied through the workpiece | Electricity | 16 | Expired |
| US7780814B2 | Wafer pre-clean reactor cable termination for selective suppression/reflection of source and bias frequency cross products | Electricity | 9 | Active |
| US7750645B2 | Method of wafer level transient sensing, threshold comparison and arc flag generation/deactivation | Electricity | 7 | Active |
| US7804040B2 | Physical vapor deposition plasma reactor with arcing suppression | Electricity | 6 | Active |
| US7268076B2 | Apparatus and method for metal plasma vapor deposition and re-sputter with source and bias power frequencies applied through the workpiece | Electricity | 5 | Expired |
| US8920611B2 | Method for controlling radial distribution of plasma ion density and ion energy at a workpiece surface by multi-frequency RF impedance tuning | Electricity | 4 | Active |
| US8435379B2 | Substrate cleaning chamber and cleaning and conditioning methods | Electricity | 4 | Active |
| US9593411B2 | Physical vapor deposition chamber with capacitive tuning at wafer support | Electricity | 4 | Active |
| US7399943B2 | Apparatus for metal plasma vapor deposition and re-sputter with source and bias power frequencies applied through the workpiece | Electricity | 3 | Expired |
| US7820020B2 | Apparatus for plasma-enhanced physical vapor deposition of copper with RF source power applied through the workpiece with a lighter-than-copper carrier gas | Electricity | 3 | Active |
| US8062484B2 | Method for plasma-enhanced physical vapor deposition of copper with RF source power applied to the target | Electricity | 3 | Active |
| US8512526B2 | Method of performing physical vapor deposition with RF plasma source power applied to the target using a magnetron | Electricity | 2 | Active |
| US9856558B2 | Physical vapor deposition method with a source of isotropic ion velocity distribution at the wafer surface | Electricity | 2 | Active |
| US9017533B2 | Apparatus for controlling radial distribution of plasma ion density and ion energy at a workpiece surface by multi-frequency RF impedance tuning | Electricity | 2 | Active |
| US8846451B2 | Methods for depositing metal in high aspect ratio features | Electricity | 2 | Active |
| US7750644B2 | System with multi-location arc threshold comparators and communication channels for carrying arc detection flags and threshold updating | Electricity | 2 | Active |
| US8563428B2 | Methods for depositing metal in high aspect ratio features | Chemistry; Metallurgy | 1 | Active |
| US10648074B2 | Physical vapor deposition with isotropic neutral and non-isotropic ion velocity distribution at the wafer surface | Electricity | 1 | Active |
| US7733095B2 | Apparatus for wafer level arc detection at an RF bias impedance match to the pedestal electrode | Electricity | 1 | Active |
| US8562798B2 | Physical vapor deposition plasma reactor with RF source power applied to the target and having a magnetron | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.