Kandabara Tapily
88Patents
9h-index
57Co-inventors
73Inventor score
Filing activity: Feb 11, 2015 → Nov 28, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10522343B2 | Method of enhancing high-k film nucleation rate and electrical mobility in a semiconductor device by microwave plasma treatment | Electricity | 36 | Active |
| US10847363B2 | Method of selective deposition for forming fully self-aligned vias | Electricity | 34 | Active |
| US10586765B2 | Buried power rails | Electricity | 31 | Active |
| US9997598B2 | Three-dimensional semiconductor device and method of fabrication | Electricity | 21 | Active |
| US10833078B2 | Semiconductor apparatus having stacked gates and method of manufacture thereof | Electricity | 16 | Active |
| US10529830B2 | Extension region for a semiconductor device | Electricity | 12 | Active |
| US10770479B2 | Three-dimensional device and method of forming the same | Electricity | 9 | Active |
| US9893161B2 | Parasitic capacitance reduction structure for nanowire transistors and method of manufacturing | Electricity | 9 | Active |
| US10727057B2 | Platform and method of operating for integrated end-to-end self-aligned multi-patterning process | Electricity | 9 | Active |
| US10453749B2 | Method of forming a self-aligned contact using selective SiO2 deposition | Electricity | 7 | Active |
| US10049913B2 | Methods for SiO2 filling of fine recessed features and selective SiO2 deposition on catalytic surfaces | Electricity | 7 | Active |
| US10378105B2 | Selective deposition with surface treatment | Electricity | 7 | Active |
| US10916472B2 | Self-aware and correcting heterogenous platform incorporating integrated semiconductor processing modules and method for using same | Emerging Cross-Sectional Technologies | 6 | Active |
| US10068764B2 | Selective metal oxide deposition using a self-assembled monolayer surface pretreatment | Electricity | 5 | Active |
| US11114381B2 | Power distribution network for 3D logic and memory | Electricity | 5 | Active |
| US9882026B2 | Method for forming a nanowire structure | Electricity | 4 | Active |
| US10930764B2 | Extension region for a semiconductor device | Electricity | 4 | Active |
| US11456212B2 | Platform and method of operating for integrated end-to-end fully self-aligned interconnect process | Emerging Cross-Sectional Technologies | 3 | Active |
| US10014213B2 | Selective bottom-up metal feature filling for interconnects | Electricity | 3 | Active |
| US11264274B2 | Reverse contact and silicide process for three-dimensional logic devices | Electricity | 3 | Active |
| US10283369B2 | Atomic layer etching using a boron-containing gas and hydrogen fluoride gas | Electricity | 3 | Active |
| US11101173B2 | Self-aware and correcting heterogenous platform incorporating integrated semiconductor processing modules and method for using same | Emerging Cross-Sectional Technologies | 3 | Active |
| US9984890B2 | Isotropic silicon and silicon-germanium etching with tunable selectivity | Electricity | 3 | Active |
| US10453681B2 | Method of selective vertical growth of a dielectric material on a dielectric substrate | Electricity | 2 | Active |
| US10734278B2 | Method of protecting low-K layers | Electricity | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.