Inventor · Tokyo, JP

Nobuyuki Tomita

20Patents
4h-index
31Co-inventors
59Inventor score

Filing activity: Mar 15, 2004 → Jun 15, 2016

Most-cited inventions

PatentTitleAreaCited byStatus
US7259408B2 Avalanche photodiode Electricity 8 Expired
US7462889B2 Avalanche photodiode Electricity 8 Expired
US7187013B2 Avalanche photodiode Emerging Cross-Sectional Technologies 7 Expired
US7038251B2 Semiconductor device Electricity 5 Expired
US8569106B2 Method for manufacturing silicon carbide semiconductor device Electricity 4 Active
US7187701B2 Ridge waveguide semiconductor laser Electricity 4 Expired
US9988738B2 Method for manufacturing SiC epitaxial wafer Electricity 3 Active
US7345325B2 Avalanche photodiode Emerging Cross-Sectional Technologies 2 Active
US8916880B2 Silicon carbide epitaxial wafer and semiconductor device Electricity 1 Active
US7763486B2 Method for manufacturing nitride semiconductor stacked structure and semiconductor light-emitting device Electricity 1 Active
US7923742B2 Method for production of a nitride semiconductor laminated structure and an optical semiconductor device Electricity 1 Active
US9422640B2 Single-crystal 4H-SiC substrate Emerging Cross-Sectional Technologies 1 Active
US7172429B2 Method of manufacturing semiconductor light emitting device Electricity 0 Expired
US9722017B2 Silicon carbide semiconductor device Electricity 0 Active
US9903048B2 Single-crystal 4H-SiC substrate Emerging Cross-Sectional Technologies 0 Active
US7632695B2 Semiconductor device manufacturing method Electricity 0 Active
US9564315B1 Manufacturing method and apparatus for manufacturing silicon carbide epitaxial wafer Chemistry; Metallurgy 0 Active
US9957638B2 Method for manufacturing silicon carbide semiconductor device Electricity 0 Active
US8679952B2 Method of manufacturing silicon carbide epitaxial wafer Electricity 0 Active
US9752254B2 Method for manufacturing a single-crystal 4H—SiC substrate Emerging Cross-Sectional Technologies 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.