Pinghai Hao
47Patents
7h-index
29Co-inventors
69Inventor score
Filing activity: Mar 3, 2003 → Jul 24, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7786507B2 | Symmetrical bi-directional semiconductor ESD protection device | Electricity | 22 | Active |
| US7235451B2 | Drain extended MOS devices with self-aligned floating region and fabrication methods therefor | Electricity | 17 | Expired |
| US7968936B2 | Quasi-vertical gated NPN-PNP ESD protection device | Electricity | 15 | Active |
| US7598547B2 | Low noise vertical variable gate control voltage JFET device in a BiCMOS process and methods to build this device | Electricity | 14 | Active |
| US6861303B2 | JFET structure for integrated circuit and fabrication method | Physics | 13 | Expired |
| US7018880B2 | Method for manufacturing a MOS transistor having reduced 1/f noise | Electricity | 11 | Expired |
| US7005354B2 | Depletion drain-extended MOS transistors and methods for making the same | Electricity | 10 | Expired |
| US7939863B2 | Area efficient 3D integration of low noise JFET and MOS in linear bipolar CMOS process | Electricity | 5 | Active |
| US7208364B2 | Methods of fabricating high voltage devices | Electricity | 5 | Expired |
| US7244651B2 | Fabrication of an OTP-EPROM having reduced leakage current | Electricity | 4 | Expired |
| US9076760B2 | JFET having width defined by trench isolation | Physics | 3 | Active |
| US6794700B1 | Capacitor having a dielectric layer including a group 17 element | Electricity | 3 | Expired |
| US8530296B2 | High voltage transistor using diluted drain | Electricity | 3 | Active |
| US7268394B2 | JFET structure for integrated circuit and fabrication method | Physics | 3 | Expired |
| US7164160B2 | Integrated circuit device with a vertical JFET | Electricity | 2 | Expired |
| US7989853B2 | Integration of high voltage JFET in linear bipolar CMOS process | Electricity | 2 | Active |
| US7307309B2 | EEPROM with etched tunneling window | Electricity | 2 | Expired |
| US8878283B2 | Quasi-vertical gated NPN-PNP ESD protection device | Electricity | 2 | Active |
| US7670888B2 | Low noise JFET | Electricity | 2 | Active |
| US7745274B2 | Gate self aligned low noise JFET | Electricity | 2 | Active |
| US7045418B2 | Semiconductor device including a dielectric layer having a gettering material located therein and a method of manufacture therefor | Emerging Cross-Sectional Technologies | 1 | Expired |
| US10134596B1 | Recessed solid state apparatuses | Electricity | 1 | Active |
| US9741718B2 | High voltage CMOS with triple gate oxide | Electricity | 1 | Active |
| US11067620B2 | HEMT wafer probe current collapse screening | Physics | 1 | Active |
| US9305688B2 | Single photomask high precision thin film resistor | Emerging Cross-Sectional Technologies | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.