Georg Tempel
51Patents
9h-index
27Co-inventors
78Inventor score
Filing activity: Apr 24, 1996 → Jan 7, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5943255A | Read only memory | Electricity | 52 | Expired |
| US5828092A | Semiconductor memory device and method for its production | Electricity | 37 | Expired |
| US7190022B2 | One transistor flash memory cell | Electricity | 25 | Expired |
| US6628544B2 | Flash memory cell and method to achieve multiple bits per cell | Physics | 21 | Expired |
| US5970338A | Method of producing an EEPROM semiconductor structure | Electricity | 17 | Expired |
| US6909139B2 | One transistor flash memory cell | Electricity | 15 | Expired |
| US6083765A | Method for producing semiconductor memory device having a capacitor | Electricity | 12 | Expired |
| US6025626A | Nonvolatile memory cell | Electricity | 11 | Expired |
| US7361924B2 | Non-volatile memory element and production method thereof and storage memory arrangement | Physics | 10 | Expired |
| US6531359B1 | Method for fabricating a memory cell array | Electricity | 9 | Expired |
| US8247861B2 | Semiconductor device and method of making same | Electricity | 8 | Active |
| US8691660B2 | Semiconductor component with trench isolation and corresponding production method | Electricity | 7 | Active |
| US6787843B2 | Nonvolatile semiconductor memory cell and associated semiconductor circuit configuration and method for the fabrication of the circuit configuration | Electricity | 7 | Expired |
| US5869860A | Ferroelectric memory device and method for producing the device | Electricity | 7 | Expired |
| US9263154B2 | Method and device for evaluating a chip manufacturing process | Physics | 6 | Active |
| US5925905A | MOS circuit configuration for switching high voltages on a semiconductor chip | Electricity | 6 | Expired |
| US6232169A | Method for producing a capacitor | Electricity | 5 | Expired |
| US7138333B2 | Process for sealing plasma-damaged, porous low-k materials | Electricity | 5 | Expired |
| US7262456B2 | Bit line structure and production method thereof | Electricity | 5 | Expired |
| US7291881B2 | Bit line structure and method of fabrication | Electricity | 5 | Active |
| US7060558B2 | Method for fabricating a field-effect transistor having a floating gate | Electricity | 4 | Expired |
| US7687842B2 | Bit line structure and method for the production thereof | Electricity | 3 | Active |
| US5883832A | Electrically erasable and programmable non-volatile storage location | Electricity | 3 | Expired |
| US7018898B2 | Non-volatile two transistor semiconductor memory cell and method for producing the same | Physics | 3 | Expired |
| US7399673B2 | Method of forming a charge-trapping memory device | Electricity | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.