Inventor · Hopewell Junction, NY, US

Kisik Choi

100Patents

9h-index

107Co-inventors

79Inventor score

Filing activity: Sep 22, 2005 → Sep 29, 2023

Most-cited inventions

Patent	Title	Area	Cited by	Status
US8048791B2	Method of forming a semiconductor device	Electricity	122	Active
US9012319B1	Methods of forming gate structures with multiple work functions and the resulting products	Electricity	71	Active
US9093467B1	Methods of forming gate structures for semiconductor devices using a replacement gate technique and the resulting devices	Electricity	55	Active
US9257348B2	Methods of forming replacement gate structures for transistors and the resulting devices	Electricity	31	Active
US7332433B2	Methods of modulating the work functions of film layers	Electricity	17	Expired
US9105497B2	Methods of forming gate structures for transistor devices for CMOS applications	Electricity	15	Active
US8941184B2	Low threshold voltage CMOS device	Electricity	13	Active
US9040404B2	Replacement metal gate structure for CMOS device	Electricity	12	Active
US8987126B2	Integrated circuit and method for fabricating the same having a replacement gate structure	Electricity	9	Active
US8932923B2	Semiconductor gate structure for threshold voltage modulation and method of making same	Electricity	8	Active
US8354719B2	Finned semiconductor device with oxygen diffusion barrier regions, and related fabrication methods	Electricity	8	Active
US8999831B2	Method to improve reliability of replacement gate device	Electricity	8	Active
US9362283B2	Gate structures for transistor devices for CMOS applications and products	Electricity	6	Active
US10748812B1	Air-gap containing metal interconnects	Electricity	6	Active
US8552505B1	Integrated circuits having improved metal gate structures and methods for fabricating same	Electricity	6	Active
US9349823B2	Methods of scaling thickness of a gate dielectric structure, methods of forming an integrated circuit, and integrated circuits	Electricity	5	Active
US10629499B2	Method and structure for forming a vertical field-effect transistor using a replacement metal gate process	Electricity	5	Active
US9496143B2	Metal gate structure for midgap semiconductor device and method of making same	Electricity	4	Active
US9041118B2	Replacement metal gate structure for CMOS device	Electricity	4	Active
US8236686B2	Dual metal gates using one metal to alter work function of another metal	Electricity	4	Active
US10943990B2	Gate contact over active enabled by alternative spacer scheme and claw-shaped cap	Electricity	4	Active
US9263344B2	Low threshold voltage CMOS device	Electricity	4	Active
US9024388B2	Methods of forming gate structures for CMOS based integrated circuit products and the resulting devices	Electricity	4	Active
US8786030B2	Gate-last fabrication of quarter-gap MGHK FET	Electricity	4	Active
US9472643B2	Method to improve reliability of replacement gate device	Electricity	3	Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.