Chunyi Wu
25Patents
4h-index
23Co-inventors
59Inventor score
Filing activity: Jun 4, 2003 → Mar 11, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7128822B2 | Leveler compounds | Chemistry; Metallurgy | 31 | Expired |
| US7662981B2 | Leveler compounds | Electricity | 16 | Active |
| US8241832B2 | Compositions and processes for photolithography | Physics | 16 | Active |
| US7510639B2 | Leveler compounds | Electricity | 13 | Active |
| US9012128B2 | Photoresist and coated substrate comprising same | Chemistry; Metallurgy | 3 | Active |
| US8722825B2 | Surface active additive and photoresist composition comprising same | Chemistry; Metallurgy | 3 | Active |
| US8603728B2 | Polymer composition and photoresist comprising the polymer | Physics | 3 | Active |
| US9274427B2 | Compositions and processes for photolithography | Chemistry; Metallurgy | 2 | Active |
| US8883400B2 | Compositions and processes for photolithography | Physics | 2 | Active |
| US9005880B2 | Compositions comprising sulfonamide material and processes for photolithography | Physics | 1 | Active |
| US9122159B2 | Compositions and processes for photolithography | Physics | 1 | Active |
| US9436082B2 | Compositions comprising base-reactive component and processes for photolithography | Physics | 1 | Active |
| US9507260B2 | Compositions and processes for photolithography | Physics | 0 | Active |
| US9475763B2 | Photoresist comprising nitrogen-containing compound | Physics | 0 | Active |
| US11846885B2 | Topcoat compositions and photolithographic methods | Electricity | 0 | Active |
| US11940731B2 | Photoresist topcoat compositions and methods of processing photoresist compositions | Physics | 0 | Active |
| US10558122B2 | Compositions comprising sulfonamide material and processes for photolithography | Physics | 0 | Active |
| US8927190B2 | Photoresist comprising nitrogen-containing compound | Physics | 0 | Active |
| US12234369B2 | Photoresist topcoat compositions and methods of processing photoresist compositions | Physics | 0 | Active |
| US10133179B2 | Pattern treatment methods | Physics | 0 | Active |
| US11809077B2 | Photoresist compositions and pattern formation methods | Physics | 0 | Active |
| US8748080B2 | Compositions and processes for photolithography | Chemistry; Metallurgy | 0 | Active |
| US10719014B2 | Photoresists comprising amide component | Physics | 0 | Active |
| US10527934B2 | Photoresists comprising ionic compound | Physics | 0 | Active |
| US8808967B2 | Compositions and processes for photolithography | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.